Norio Kuji

According to our database, Norio Kuji authored at least 9 papers between 1985 and 2010.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2010

Hybrid processing system for sensor networks based on an event-driven framework.

Noriharu Miyaho, Yoichi Iwaki, Tomohiro Yamazaki, Norio Kuji

IET Commun., 2010

2001

EB-Testing-Pad Method and Its Evaluation by Actual Devices.

Norio Kuji, Takako Ishihara

Proceedings of the 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, 2001

1997

Guided-Probe Diagnosis of Macro-Cell-Designed LSI Circuits.

Norio Kuji

Proceedings of the 6th Asian Test Symposium (ATS '97), 17-18 November 1997, 1997

1990

Marginal fault diagnosis based on e-beam static fault imaging with CAD interface.

Norio Kuji, Kiyoshi Matsumoto

Proceedings of the Proceedings IEEE International Test Conference 1990, 1990

1986

FINDER: A CAD System-Based Electron Beam Tester for Fault Diagnosis of VLSI Circuits.

Norio Kuji, Teruo Tamama, M. Nagatani

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1986

Integrating an Electron-Beam System into VLSI Fault Diagnosis.

Teruo Tamama, Norio Kuji

IEEE Des. Test, 1986

An Automated F-Beam Tester with CAD Interface, "Finder": A Powerful Tool for Fault Diagnosis of ASICs.

Norio Kuji, Teruo Tamama

Proceedings of the Proceedings International Test Conference 1986, 1986

1985

A Fully-Automated Electron Beam Test System for VLSI Circuits.

Norio Kuji, Teruo Tamama, Takao Yano

IEEE Des. Test, 1985

Automated Fault Diagnostic EB Tester and Its Application to a 40K-Gate VLSI Circuit.

Norio Kuji, Teruo Tamama

Proceedings of the Proceedings International Test Conference 1985, 1985