Norio Koike

According to our database, Norio Koike authored at least 3 papers between 2000 and 2005.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2005

A Test Structure for Two-Dimensional Analysis of MOSFETs by Hot-Carrier-Induced Photoemission.

Toshihiro Matsuda, Hiroaki Takeuchi, Akira Muramatsu, Hideyuki Iwata, Takashi Ohzone, Kyoji Yamashita, Norio Koike, Ken-ichiro Tatsuuma

IEICE Trans. Electron., 2005

2000

GLACIER: A Hot Carrier Gate Level Circuit Characterization and Simulation System for VLSI Design.

Lifeng Wu, Jingkun Fang, Heting Yan, Ping Chen, Alvin I-Hsien Chen, Yoshifumi Okamoto, Chune-Sin Yeh, Zhihong Liu, Nobufusa Iwanishi, Norio Koike, Hirokazu Yonezawa, Yoshiyuki Kawakami

Proceedings of the 1st International Symposium on Quality of Electronic Design (ISQED 2000), 2000

Gate-level aged timing simulation methodology for hot-carrier reliability assurance.

Yoshiyuki Kawakami, Jingkun Fang, Hirokazu Yonezawa, Nobufusa Iwanishi, Lifeng Wu, Alvin I-Hsien Chen, Norio Koike, Ping Chen, Chune-Sin Yeh, Zhihong Liu

Proceedings of ASP-DAC 2000, 2000