Noriaki Nakayama

According to our database, Noriaki Nakayama authored at least 16 papers between 1995 and 2010.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2010

Decomposition of drain-current variation into gain-factor and threshold voltage variations.

Takashi Sato, Takumi Uezono, Noriaki Nakayama, Kazuya Masu

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2010), May 30, 2010

2009

Accurate Array-Based Measurement for Subthreshold-Current of MOS Transistors.

Takashi Sato, Hiroyuki Ueyama, Noriaki Nakayama, Kazuya Masu

IEEE J. Solid State Circuits, 2009

Physical design challenges to nano-CMOS circuits.

Kazuya Masu, Noboru Ishihara, Noriaki Nakayama, Takashi Sato, Shuhei Amakawa

IEICE Electron. Express, 2009

2008

Layout-Aware Compact Model of MOSFET Characteristics Variations Induced by STI Stress.

Kenta Yamada, Takashi Sato, Shuhei Amakawa, Noriaki Nakayama, Kazuya Masu, Shigetaka Kumashiro

IEICE Trans. Electron., 2008

An Evaluation Method of the Number of Monte Carlo STA Trials for Statistical Path Delay Analysis.

Masanori Imai, Takashi Sato, Noriaki Nakayama, Kazuya Masu

IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2008

Non-parametric statistical static timing analysis: an SSTA framework for arbitrary distribution.

Masanori Imai, Takashi Sato, Noriaki Nakayama, Kazuya Masu

Proceedings of the 45th Design Automation Conference, 2008

Determination of optimal polynomial regression function to decompose on-die systematic and random variations.

Takashi Sato, Hiroyuki Ueyama, Noriaki Nakayama, Kazuya Masu

Proceedings of the 13th Asia South Pacific Design Automation Conference, 2008

2007

A MOS Transistor-Array for Accurate Measurement of Subthreshold Leakage Variation.

Takashi Sato, Takumi Uezono, Shiho Hagiwara, Kenichi Okada, Shuhei Amakawa, Noriaki Nakayama, Kazuya Masu

Proceedings of the 8th International Symposium on Quality of Electronic Design (ISQED 2007), 2007

2005

A Compact Model of the Pinch-off Region of 100 nm MOSFETs Based on the Surface-Potential.

Dondee Navarro, Takeshi Mizoguchi, Masami Suetake, Kazuya Hisamitsu, Hiroaki Ueno, Mitiko Miura-Mattausch, Hans Jürgen Mattausch, Shigetaka Kumashiro, Tetsuya Yamaguchi, Kyoji Yamashita, Noriaki Nakayama

IEICE Trans. Electron., 2005

1/<i>f</i>-Noise Characteristics in 100 nm-MOSFETs and Its Modeling for Circuit Simulation.

Shizunori Matsumoto, Hiroaki Ueno, Satoshi Hosokawa, Toshihiko Kitamura, Mitiko Miura-Mattausch, Hans Jürgen Mattausch, Tatsuya Ohguro, Shigetaka Kumashiro, Tetsuya Yamaguchi, Kyoji Yamashita, Noriaki Nakayama

IEICE Trans. Electron., 2005

2003

Temperature-independence-point properties for 0.1μm-scale pocket-implant technologies and the impact on circuit design.

Kazuya Hisamitsu, Hiroaki Ueno, Masayasu Tanaka, Daisuke Kitamaru, Mitiko Miura-Mattausch, Hans Jürgen Mattausch, Shigetaka Kumashiro, Tetsuya Yamaguchi, Kyoji Yamashita, Noriaki Nakayama

Proceedings of the 2003 Asia and South Pacific Design Automation Conference, 2003

2002

On discrete random dopant modeling in drift-diffusion simulations: physical meaning of 'atomistic' dopants.

Nobuyuki Sano, Kazuya Matsuzawa, Mikio Mukai, Noriaki Nakayama

Microelectron. Reliab., 2002

Circuit Simulation Models for Coming MOSFET Generations.

Mitiko Miura-Mattausch, Hiroaki Ueno, Hans Jürgen Mattausch, Shigetaka Kumashiro, Tetsuya Yamaguchi, Kyoji Yamashita, Noriaki Nakayama

IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2002

2001

Test-circuit-based extraction of inter- and intra-chip MOSFET-performance variations for analog-design reliability.

Shizunori Matsumoto, Hans Jürgen Mattausch, S. Ooshiro, Y. Tatsumi, Mitiko Miura-Mattausch, Shigetaka Kumashiro, Terufumi Yamaguchi, Kyoji Yamashita, Noriaki Nakayama

Proceedings of the IEEE 2001 Custom Integrated Circuits Conference, 2001

Correlation method of circuit-performance and technology fluctuations for improved design reliability.

D. Miyawaki, Shizunori Matsumoto, Hans Jürgen Mattausch, S. Ooshiro, Masami Suetake, Mitiko Miura-Mattausch, Shigetaka Kumashiro, Tetsuya Yamaguchi, Kyoji Yamashita, Noriaki Nakayama

Proceedings of ASP-DAC 2001, 2001

1995

Numerical simulation of neuronal population coding: influences of noise and tuning width on the coding error.

Shoji Tanaka, Noriaki Nakayama

Biol. Cybern., 1995