Nor Zaidi Haron

According to our database, Nor Zaidi Haron authored at least 11 papers between 2009 and 2015.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2015

Testing Open Defects in Memristor-Based Memories.

Said Hamdioui, Mottaqiallah Taouil, Nor Zaidi Haron

IEEE Trans. Computers, 2015

2012

DfT schemes for resistive open defects in RRAMs.

Nor Zaidi Haron, Said Hamdioui

Proceedings of the 2012 Design, Automation & Test in Europe Conference & Exhibition, 2012

2011

Redundant Residue Number System Code for Fault-Tolerant Hybrid Memories.

Nor Zaidi Haron, Said Hamdioui

ACM J. Emerg. Technol. Comput. Syst., 2011

NBTI Monitoring and Design for Reliability in Nanoscale Circuits.

Seyab Khan, Nor Zaidi Haron, Said Hamdioui, Francky Catthoor

Proceedings of the 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2011

Cost-efficient fault-tolerant decoder for hybrid nanoelectronic memories.

Nor Zaidi Haron, Said Hamdioui

Proceedings of the Design, Automation and Test in Europe, 2011

On Defect Oriented Testing for Hybrid CMOS/Memristor Memory.

Nor Zaidi Haron, Said Hamdioui

Proceedings of the 20th IEEE Asian Test Symposium, 2011

2010

ECC design for fault-tolerant crossbar memories: A case study.

Nor Zaidi Haron, Said Hamdioui, Zaiyan Ahyadi

Proceedings of the 5th International Design and Test Workshop, 2010

High-Performance Cluster-Fault Tolerance Scheme for Hybrid Nanoelectronic Memories.

Nor Zaidi Haron, Said Hamdioui

Proceedings of the 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2010

2009

Emerging non-CMOS nanoelectronic devices - What are they?.

Nor Zaidi Haron, Said Hamdioui, Sorin Cotofana

Proceedings of the 4th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, 2009

Residue-based code for reliable hybrid memories.

Nor Zaidi Haron, Said Hamdioui

Proceedings of the 2009 IEEE/ACM International Symposium on Nanoscale Architectures, 2009

Using RRNS Codes for Cluster Faults Tolerance in Hybrid Memories.

Nor Zaidi Haron, Said Hamdioui

Proceedings of the 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2009