Nivard Aymerich

According to our database, Nivard Aymerich authored at least 8 papers between 2011 and 2021.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2021

Accelerating ML Recommendation with over a Thousand RISC-V/Tensor Processors on Esperanto's ET-SoC-1 Chip.

David R. Ditzel, Roger Espasa, Nivard Aymerich, Allen Baum, Tom Berg, Jim Burr, Eric Hao, Jayesh Iyer, Miquel Izquierdo, Shankar Jayaratnam, Darren Jones, Chris Klingner, Jin Kim, Stephen Lee, Marc Lupon, Grigorios Magklis, Bojan Maric, Rajib Nath, Mike Neilly, J. Duane Northcutt, Bill Orner, Jose Renau, Gerard Reves, Xavier Reves, Tom Riordan, Pedro Sanchez, Sridhar Samudrala, Guillem Sole, Raymond Tang, Tommy Thorn, Francisco Torres, Sebastia Tortella, Daniel Yau

Proceedings of the IEEE Hot Chips 33 Symposium, 2021

2014

Strategies to enhance the 3T1D-DRAM cell variability robustness beyond 22 nm.

Esteve Amat, Carmen G. Almudéver, Nivard Aymerich, Ramon Canal, Antonio Rubio

Microelectron. J., 2014

2013

Systematic and random variability analysis of two different 6T-SRAM layout topologies.

Esteve Amat, E. Amatllé, Sergio Gómez, Nivard Aymerich, Carmen G. Almudéver, Francesc Moll, Antonio Rubio

Microelectron. J., 2013

Extending the fundamental error bounds for asymmetric error reliable computation.

Nivard Aymerich, Antonio Rubio

Proceedings of the IEEE/ACM International Symposium on Nanoscale Architectures, 2013

Variability robustness enhancement for 7nm FinFET 3T1D-DRAM cells.

Esteve Amat, Carmen G. Almudéver, Nivard Aymerich, Antonio Rubio, Ramon Canal

Proceedings of the IEEE 56th International Midwest Symposium on Circuits and Systems, 2013

2012

Fault-tolerant nanoscale architecture based on linear threshold gates with redundancy.

Nivard Aymerich, Antonio Rubio

Microprocess. Microsystems, 2012

Impact of positive bias temperature instability (PBTI) on 3T1D-DRAM cells.

Nivard Aymerich, Shrikanth Ganapathy, Antonio Rubio, Ramon Canal, Antonio González

Integr., 2012

2011

New reliability mechanisms in memory design for sub-22nm technologies.

Nivard Aymerich, A. Asenov, Andrew R. Brown, Ramon Canal, Binjie Cheng, Joan Figueras, Antonio González, Enric Herrero, S. Markov, Miguel Miranda, Peyman Pouyan, Tanausú Ramírez, Antonio Rubio, Elena I. Vatajelu, Xavier Vera, Xingsheng Wang, Paul Zuber

Proceedings of the 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 2011