Ninoslav Stojadinovic
According to our database1,
Ninoslav Stojadinovic
authored at least 22 papers
between 2001 and 2018.
Collaborative distances:
Collaborative distances:
Awards
IEEE Fellow
IEEE Fellow 2004, "For contributions to the reliability physics of metal-oxide-semiconductor devices.".
Timeline
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Book In proceedings Article PhD thesis Dataset OtherLinks
On csauthors.net:
Bibliography
2018
Microelectron. Reliab., 2018
2011
NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions.
Microelectron. Reliab., 2011
2010
Threshold voltage instabilities in p-channel power VDMOSFETs under pulsed NBT stress.
Microelectron. Reliab., 2010
2009
Microelectron. Reliab., 2009
2008
Microelectron. Reliab., 2008
Degradation behavior of Ta<sub>2</sub>O<sub>5</sub> stacks and its dependence on the gate electrode.
Microelectron. Reliab., 2008
IET Circuits Devices Syst., 2008
2007
Influence of polysilicon film thickness on radiation response of advanced excimer laser annealed polycrystalline silicon thin film transistors.
Microelectron. Reliab., 2007
Negative bias temperature instabilities in sequentially stressed and annealed p-channel power VDMOSFETs.
Microelectron. Reliab., 2007
2006
Microelectron. Reliab., 2006
2005
Microelectron. Reliab., 2005
2004
Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors.
Microelectron. Reliab., 2004
2003
Effects of burn-in stressing on post-irradiation annealing response of power VDMOSFETs.
Microelectron. Reliab., 2003
2002
Effects of high electric field and elevated-temperature bias stressing on radiation response in power VDMOSFETs.
Microelectron. Reliab., 2002
Microelectron. Reliab., 2002
Dependability of Engineering Systems: J.M. Nahman, Springer-Verlag, Berlin, Heidelberg, New York, 2002, 192 pages.
Microelectron. Reliab., 2002
2001
Microelectron. Reliab., 2001
Understanding Semiconductor Devices; Sima Dimitrijev. Oxford University Press, New York. 2000. ISBN: 0-19-513186-X.
Microelectron. Reliab., 2001