Nilotpal Choudhury
According to our database1,
Nilotpal Choudhury
authored at least 5 papers
between 2020 and 2022.
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Bibliography
2022
On the PBTI Reliability of Low EOT Negative Capacitance 1.8 nm HfO2-ZrO2 Superlattice Gate Stack on Lg=90 nm nFETs.
Proceedings of the IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), 2022
Decoupling of NBTI and Pure HCD Contributions in p-GAA SNS FETs Under Mixed VG/VD Stress.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
2021
Proceedings of the IEEE International Reliability Physics Symposium, 2021
2020
Analysis of BTI, SHE Induced BTI and HCD Under Full VG/VD Space in GAA Nano-Sheet N and P FETs.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
Analysis of The Hole Trapping Detrapping Component of NBTI Over Extended Temperature Range.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020