Nikhil Puri
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Bibliography
2017
A Sub-0.5V Reliability Aware-Negative Bitline Write-Assisted 8T DP-SRAM and WL Strapping Novel Architecture to Counter Dual Patterning Issues in 10nm FinFET.
Proceedings of the 30th International Conference on VLSI Design and 16th International Conference on Embedded Systems, 2017