Nik Sumikawa
According to our database1,
Nik Sumikawa
authored at least 25 papers
between 2011 and 2020.
Collaborative distances:
Collaborative distances:
Timeline
2011
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2020
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Book In proceedings Article PhD thesis Dataset OtherLinks
On csauthors.net:
Bibliography
2020
Proceedings of the IEEE International Test Conference, 2020
2019
Proceedings of the 37th IEEE VLSI Test Symposium, 2019
Proceedings of the International Symposium on VLSI Design, Automation and Test, 2019
Proceedings of the IEEE International Test Conference, 2019
Proceedings of the IEEE International Test Conference in Asia, 2019
2018
Proceedings of the IEEE International Test Conference, 2018
2017
Proceedings of the 35th IEEE VLSI Test Symposium, 2017
Proceedings of the IEEE International Test Conference, 2017
Proceedings of the IEEE International Test Conference, 2017
2016
Proceedings of the 34th IEEE VLSI Test Symposium, 2016
2015
Proceedings of the 2015 IEEE International Test Conference, 2015
Proceedings of the IEEE International Reliability Physics Symposium, 2015
Proceedings of the 21st IEEE International On-Line Testing Symposium, 2015
2014
Proceedings of the 2014 International Test Conference, 2014
Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium, 2014
2013
Proceedings of the 2013 IEEE International Test Conference, 2013
2012
Proceedings of Technical Program of 2012 VLSI Design, Automation and Test, 2012
Proceedings of the 2012 IEEE International Test Conference, 2012
Proceedings of the 2012 IEEE International Test Conference, 2012
Functional test content optimization for peak-power validation - An experimental study.
Proceedings of the 2012 IEEE International Test Conference, 2012
Proceedings of the 2012 IEEE/ACM International Conference on Computer-Aided Design, 2012
2011
Proceedings of the 29th IEEE VLSI Test Symposium, 2011
Proceedings of the 2011 IEEE International Test Conference, 2011
Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits.
Proceedings of the Design, Automation and Test in Europe, 2011