Nie Liu

According to our database, Nie Liu authored at least 1 paper in 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2018

New insights into the HCI degradation of pass-gate transistor in advanced FinFET technology.

Pengpeng Ren, Changze Liu, Sanping Wan, Jiayang Zhang, Zhuoqing Yu, Nie Liu, Yongsheng Sun, Runsheng Wang, Canhui Zhan, Zhenghao Gan, Waisum Wong, Yu Xia, Ru Huang

Proceedings of the IEEE International Reliability Physics Symposium, 2018