Nidhi Batra
According to our database1,
Nidhi Batra
authored at least 3 papers
in 2016.
Collaborative distances:
Collaborative distances:
Timeline
2016
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Bibliography
2016
An effective test methodology enabling detection of weak bits in SRAMs: Case study in 28nm FDSOI.
Proceedings of the 20th International Symposium on VLSI Design and Test, 2016
A method to estimate effectiveness of weak bit test: Comparison of weak pMOS and WL boost based test - 28nm FDSOI implementation.
Proceedings of the 29th IEEE International System-on-Chip Conference, 2016
Static Noise Margin based Yield Modelling of 6T SRAM for Area and Minimum Operating Voltage Improvement using Recovery Techniques.
Proceedings of the 26th edition on Great Lakes Symposium on VLSI, 2016