Nicolo Zagni

Orcid: 0000-0003-2454-1883

According to our database1, Nicolo Zagni authored at least 9 papers between 2017 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Bibliography

2023
Reliability of HfO<sub>2</sub>-Based Ferroelectric FETs: A Critical Review of Current and Future Challenges.
Proc. IEEE, February, 2023

2022
Fe-Traps Influence on Time-dependent Breakdown Voltage in 0.1-μm GaN HEMTs for 5G Applications.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

A Novel Temperature Estimation Technique Exploiting Carrier Emission from Buffer Traps.
Proceedings of the 52nd IEEE European Solid-State Device Research Conference, 2022

2020
Trap Dynamics Model Explaining the RON Stress/Recovery Behavior in Carbon-Doped Power AlGaN/GaN MOS-HEMTs.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019
Deep Water: Predicting Water Meter Failures Through a Human-Machine Intelligence Collaboration.
Proceedings of the Human Interaction and Emerging Technologies, 2019

A Paradox in ML Design: Less data for a smarter water metering cognification experience.
Proceedings of the 5th EAI International Conference on Smart Objects and Technologies for Social Good, 2019

2018
Energy-Efficient Logic-in-Memory I-bit Full Adder Enabled by a Physics-Based RRAM Compact Model.
Proceedings of the 48th European Solid-State Device Research Conference, 2018

2017
Variability and sensitivity to process parameters variations in InGaAs dual-gate ultra-thin body MOSFETs: A scaling perspective.
Proceedings of the 27th International Symposium on Power and Timing Modeling, 2017

A new verilog-A compact model of random telegraph noise in oxide-based RRAM for advanced circuit design.
Proceedings of the 47th European Solid-State Device Research Conference, 2017


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