Nicolas Borrel

According to our database, Nicolas Borrel authored at least 7 papers in 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2015

Electrical model of an inverter body-biased structure in triple-well technology under pulsed photoelectric laser stimulation.

Nicolas Borrel, Clement Champeix, Edith Kussener, Wenceslas Rahajandraibe, Mathieu Lisart, Jean-Max Dutertre, Alexandre Sarafianos

Microelectron. Reliab., 2015

Dynamic current reduction of CMOS digital circuits through design and process optimization.

Jordan Innocenti, Loïc Welter, Nicolas Borrel, Franck Julien, Jean-Michel Portal, Jacques Sonzogni, Laurent Lopez, Pascal Masson, Stephan Niel, Philippe Dreux, Julia Castellan

Proceedings of the 25th International Workshop on Power and Timing Modeling, 2015

Electrical model of an NMOS body biased structure in triple-well technology under photoelectric laser stimulation.

Nicolas Borrel, Clement Champeix, Mathieu Lisart, Alexandre Sarafianos, Edith Kussener, Wenceslas Rahajandraibe, Jean-Max Dutertre

Proceedings of the IEEE International Reliability Physics Symposium, 2015

Laser fault injection into SRAM cells: Picosecond versus nanosecond pulses.

Marc Lacruche, Nicolas Borrel, Clement Champeix, Cyril Roscian, Alexandre Sarafianos, Jean-Baptiste Rigaud, Jean-Max Dutertre, Edith Kussener

Proceedings of the 21st IEEE International On-Line Testing Symposium, 2015

Experimental validation of a Bulk Built-In Current Sensor for detecting laser-induced currents.

Clement Champeix, Nicolas Borrel, Jean-Max Dutertre, Bruno Robisson, Mathieu Lisart, Alexandre Sarafianos

Proceedings of the 21st IEEE International On-Line Testing Symposium, 2015

SEU sensitivity and modeling using pico-second pulsed laser stimulation of a D Flip-Flop in 40 nm CMOS technology.

Clement Champeix, Nicolas Borrel, Jean-Max Dutertre, Bruno Robisson, Mathieu Lisart, Alexandre Sarafianos

Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2015

Influence of triple-well technology on laser fault injection and laser sensor efficiency.

Nicolas Borrel, Clement Champeix, Edith Kussener, Wenceslas Rahajandraibe, Mathieu Lisart, Alexandre Sarafianos, Jean-Max Dutertre

Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2015