Nicola Wrachien

According to our database, Nicola Wrachien authored at least 15 papers between 2007 and 2018.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2018

Effects of stair case gate bias stress in IGZO/Al₂O₃ flexible TFTs.

Marco Buonomo, Nicola Wrachien, Nicolò Lago, Giuseppe Cantarella, Andrea Cester

Microelectron. Reliab., 2018

Analysis of the effects of voltage pulses on P3HT: PCBM polymeric solar cells by means of TLP technique.

Marco Buonomo, Lorenzo Torto, Marco Barbato, Nicola Wrachien, Antonio Rizzo, Suren A. Gevorgyan, Frederik C. Krebs, Andrea Cester

Microelectron. Reliab., 2018

2015

Effects of thermal and electrical stress on DH4T-based organic thin-film-transistors with PMMA gate dielectrics.

Nicola Wrachien, Nicolò Lago, Antonio Rizzo, Riccardo D'Alpaos, Andrea Stefani, Guido Turatti, Michele Muccini, Gaudenzio Meneghesso, Andrea Cester

Microelectron. Reliab., 2015

Effects of constant voltage and constant current stress in PCBM: P3HT solar cells.

Andrea Cester, Antonio Rizzo, A. Bazzega, Nicolò Lago, J. Favaro, Marco Barbato, Nicola Wrachien, Suren A. Gevorgyan, Michael Corazza, Frederik C. Krebs

Microelectron. Reliab., 2015

Degradation mechanisms of dye-sensitized solar cells: Light, bias and temperature effects.

Andrea Cester, Nicola Wrachien, Massimiliano Bon, Gaudenzio Meneghesso, Roberta Bertani, Roberto Tagliaferro, Simone Casolucci, Thomas M. Brown, Andrea Reale, Aldo Di Carlo

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2014

Stress-induced degradation of p- and n-type organic thin-film-transistors in the ON and OFF states.

Nicola Wrachien, Andrea Cester, Nicolò Lago, Gaudenzio Meneghesso, Riccardo D'Alpaos, Andrea Stefani, Guido Turatti, Michele Muccini

Microelectron. Reliab., 2014

Effects of constant voltage stress on organic complementary logic inverters.

Nicola Wrachien, Andrea Cester, Nicolò Lago, Gaudenzio Meneghesso, Riccardo D'Alpaos, Andrea Stefani, Guido Turatti, Michele Muccini

Proceedings of the 44th European Solid State Device Research Conference, 2014

2013

Effects of constant voltage stress on p- and n-type organic thin film transistors with poly(methyl methacrylate) gate dielectric.

Nicola Wrachien, Andrea Cester, Daniele Bari, Raffaella Capelli, Riccardo D'Alpaos, Michele Muccini, Andrea Stefani, Guido Turatti, Gaudenzio Meneghesso

Microelectron. Reliab., 2013

Comparison between positive and negative constant current stress on dye-sensitized solar cells.

Daniele Bari, Nicola Wrachien, R. Tagliaferro, Thomas M. Brown, Andrea Reale, Aldo Di Carlo, Gaudenzio Meneghesso, Andrea Cester

Microelectron. Reliab., 2013

2012

Enhanced permanent degradation of organic TFT under electrical stress and visible light exposure.

Nicola Wrachien, Daniel Bari, Jaroslav Kovác, Jan Jakabovic, Daniel Donoval, Gaudenzio Meneghesso, Andrea Cester

Microelectron. Reliab., 2012

Reliability study of dye-sensitized solar cells by means of solar simulator and white LED.

Daniele Bari, Nicola Wrachien, Roberto Tagliaferro, Thomas M. Brown, Andrea Reale, Aldo Di Carlo, Gaudenzio Meneghesso, Andrea Cester

Microelectron. Reliab., 2012

2011

Thermal stress effects on Dye-Sensitized Solar Cells (DSSCs).

Daniele Bari, Nicola Wrachien, R. Tagliaferro, Stefano Penna, Thomas M. Brown, Andrea Reale, Aldo Di Carlo, Gaudenzio Meneghesso, Andrea Cester

Microelectron. Reliab., 2011

2010

Advanced memories to overcome the flash memory weaknesses.

Nicola Wrachien

PhD thesis, 2010

Thermal and electrical stress effects of electrical and optical characteristics of Alq3/NPD OLED.

Andrea Cester, Daniele Bari, J. Framarin, Nicola Wrachien, Gaudenzio Meneghesso, S. Xia, V. Adamovich, J. J. Brown

Microelectron. Reliab., 2010

2007

Ionising radiation and electrical stress on nanocrystal memory cell array.

Andrea Cester, A. Gasperin, Nicola Wrachien, Alessandro Paccagnella, Valentina Ancarani, Cosimo Gerardi

Microelectron. Reliab., 2007