Nick M. Ridler
Orcid: 0000-0002-1462-2914
According to our database1,
Nick M. Ridler
authored at least 24 papers
between 2003 and 2024.
Collaborative distances:
Collaborative distances:
Awards
IEEE Fellow
IEEE Fellow 2014, "For contributions to traceability in precision high-frequency electromagnetic measurements".
Timeline
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On csauthors.net:
Bibliography
2024
Characterizing S-Parameters of Microwave Coaxial Devices With up to Four Ports at Temperatures of 3 K and Above for Quantum Computing Applications.
IEEE Trans. Instrum. Meas., 2024
Improvements to Millimeter-Wave Dielectric Measurement Using Material Characterization Kit (MCK).
IEEE Trans. Instrum. Meas., 2024
Characterisation of Power Transistors for Wireless Network Applications Using Passive and Active Load-Pull.
Proceedings of the 2024 IEEE International Symposium on Measurements & Networking (M&N), 2024
2023
Determination of the Permittivity of Transmission Lines at Milli-Kelvin Temperatures.
IEEE Access, 2023
Polymer-Based 3-D Printed 140 to 220 GHz Metal Waveguide Thru Lines, Twist and Filters.
IEEE Access, 2023
2022
Uncertainties in Small-Signal and Large-Signal Measurements of RF Amplifiers Using a VNA.
IEEE Instrum. Meas. Mag., 2022
IEEE Access, 2022
Characterizing Scattering Parameters of Superconducting Quantum Integrated Circuits at Milli-Kelvin Temperatures.
IEEE Access, 2022
IEEE Access, 2022
2021
Assessing the Impact of Data Filtering Techniques on Material Characterization at Millimeter-Wave Frequencies.
IEEE Trans. Instrum. Meas., 2021
Polymer-Based 3-D Printed 140-220 GHz Low-Cost Quasi-Optical Components and Integrated Subsystem Assembly.
IEEE Access, 2021
Microwave Characterization of Conductive PLA and Its Application to a 12 to 18 GHz 3-D Printed Rotary Vane Attenuator.
IEEE Access, 2021
2020
Characterization of Dielectric Materials at WR-15 Band (50-75 GHz) Using VNA-Based Technique.
IEEE Trans. Instrum. Meas., 2020
Proceedings of the 2020 International Conference on UK-China Emerging Technologies, 2020
2019
Establishing a New Form of Primary Impedance Standard at Millimeter-Wave Frequencies.
IEEE Trans. Instrum. Meas., 2019
Microwave Characterization of Low-Loss FDM 3-D Printed ABS With Dielectric-Filled Metal-Pipe Rectangular Waveguide Spectroscopy.
IEEE Access, 2019
IEEE Access, 2019
2017
Metrology State-of-the-Art and Challenges in Broadband Phase-Sensitive Terahertz Measurements.
Proc. IEEE, 2017
2011
Comparison Between NPL and NMIJ of Diameter and Scattering Parameter Measurements of Precision 1.85 mm Coaxial Air Lines.
IEEE Trans. Instrum. Meas., 2011
2009
Comparison Between Two National Metrology Institutes of Diameters and Characteristic Impedance of Coaxial Air Lines.
IEEE Trans. Instrum. Meas., 2009
2003
Generalized adaptive calibration schemes for precision RF vector network analyzer measurements.
IEEE Trans. Instrum. Meas., 2003
Traceability via the Internet for microwave measurements using vector network analyzers.
IEEE Trans. Instrum. Meas., 2003
An interpolation scheme for precision intermediate frequency reflection coefficient measurement.
IEEE Trans. Instrum. Meas., 2003