Nian Zhan

According to our database, Nian Zhan authored at least 2 papers between 2003 and 2005.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2005

Dielectric breakdown characteristics and interface trapping of hafnium oxide films.

Nian Zhan, M. C. Poon, Hei Wong, K. L. Ng, Chi-Wah Kok

Microelectron. J., 2005

2003

Electrical characterization of the hafnium oxide prepared by direct sputtering of Hf in oxygen with rapid thermal annealing.

K. L. Ng, Nian Zhan, Chi-Wah Kok, M. C. Poon, Hei Wong

Microelectron. Reliab., 2003