Néstor Berbel
Orcid: 0000-0002-0158-1068
According to our database1,
Néstor Berbel
authored at least 13 papers
between 2009 and 2024.
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Bibliography
2024
Variable frequency control strategy for transformers surge current reduction in DAB converters.
Proceedings of the 33rd IEEE International Symposium on Industrial Electronics, 2024
Series-Parallel Connection of GaN-based DAB Converters for Electric Vehicle Charging.
Proceedings of the 33rd IEEE International Symposium on Industrial Electronics, 2024
Proceedings of the 33rd IEEE International Symposium on Industrial Electronics, 2024
Evaluating Modulation Techniques in a Hybrid T-Type Power Converter based on GaN and SiC Semiconductors for Electric Transport.
Proceedings of the 33rd IEEE International Symposium on Industrial Electronics, 2024
2023
Constant Common-Mode Voltage Strategies Using Sigma-Delta Modulators in Five-Phase VSI.
IEEE Trans. Ind. Electron., 2023
2021
Efficiency Comparison of Power Converters Based on SiC and GaN Semiconductors at High Switching Frequencies.
Proceedings of the 30th IEEE International Symposium on Industrial Electronics, 2021
Performance Assessment of a Wide-Bandgap-Semiconductor Dual-Active-Bridge Converter for Electrical Vehicles.
Proceedings of the 30th IEEE International Symposium on Industrial Electronics, 2021
High-Frequency Spread-Spectrum Modulations for Wide-Bandgap Voltage Source Converters.
Proceedings of the 22nd IEEE International Conference on Industrial Technology, 2021
2019
Study of modulation techniques applied to full bridge single-phase inverters based on wide-bandgap semiconductors.
Proceedings of the IECON 2019, 2019
2013
Characterization of conducted emission at high frequency under different temperature.
Proceedings of the 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, 2013
2011
Study of the impact of hot carrier injection to immunity of MOSFET to electromagnetic interferences.
Microelectron. Reliab., 2011
Experimental verification of the usefulness of the nth power law MOSFET model under hot carrier wearout.
Microelectron. Reliab., 2011
2009
Modelling and experimental verification of the impact of negative bias temperature instability on CMOS inverter.
Microelectron. Reliab., 2009