Nektarios Kranitis
Orcid: 0000-0002-0521-4433
According to our database1,
Nektarios Kranitis
authored at least 43 papers
between 1999 and 2024.
Collaborative distances:
Collaborative distances:
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Bibliography
2024
A Parallel Architecture and Implementation for Near-Lossless Hyperspectral Image Compression Based on CCSDS 123.0-B-2 With Scalable Data-Rate Performance.
IEEE Trans. Very Large Scale Integr. Syst., September, 2024
2022
Efficient Hardware Architectures and Implementations of Packet-Level Erasure Coding Schemes for High Data Rate Reliable Satellite Communications.
IEEE Trans. Aerosp. Electron. Syst., 2022
An Efficient Architecture and High-Throughput Implementation of CCSDS-123.0-B-2 Hybrid Entropy Coder Targeting Space-Grade SRAM FPGA Technology.
IEEE Trans. Aerosp. Electron. Syst., 2022
Proceedings of the 30th IFIP/IEEE 30th International Conference on Very Large Scale Integration, 2022
2021
A 3.3 Gbps CCSDS 123.0-B-1 Multispectral & Hyperspectral Image Compression Hardware Accelerator on a Space-Grade SRAM FPGA.
IEEE Trans. Emerg. Top. Comput., 2021
2020
High-Performance COTS FPGA SoC for Parallel Hyperspectral Image Compression With CCSDS-123.0-B-1.
IEEE Trans. Very Large Scale Integr. Syst., 2020
IEEE Trans. Very Large Scale Integr. Syst., 2020
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2020
2019
Analyzing the Resilience to SEUs of an Image Data Compression Core in a COTS SRAM FPGA.
Proceedings of the NASA/ESA Conference on Adaptive Hardware and Systems, 2019
2016
Proceedings of the 22nd IEEE International Symposium on On-Line Testing and Robust System Design, 2016
2015
Proceedings of the 21st IEEE International On-Line Testing Symposium, 2015
2014
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014
Power-aware optimization of software-based self-test for L1 caches in microprocessors.
Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium, 2014
Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium, 2014
2013
Software-Based Self Test Methodology for On-Line Testing of L1 Caches in Multithreaded Multicore Architectures.
IEEE Trans. Very Large Scale Integr. Syst., 2013
2012
IEEE Trans. Dependable Secur. Comput., 2012
Proceedings of the 17th IEEE European Test Symposium, 2012
2011
Proceedings of the 2011 IEEE International Test Conference, 2011
2010
A software-based self-test methodology for in-system testing of processor cache tag arrays.
Proceedings of the 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 2010
SBST for on-line detection of hard faults in multiprocessor applications under energy constraints.
Proceedings of the 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 2010
Proceedings of the 28th International Conference on Computer Design, 2010
2008
IEEE Des. Test Comput., 2008
Proceedings of the 2008 IEEE International Test Conference, 2008
Proceedings of the 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 2008
2007
Proceedings of the 12th European Test Symposium, 2007
2006
Proceedings of the 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 2006
Optimal periodic testing of intermittent faults in embedded pipelined processor applications.
Proceedings of the Conference on Design, Automation and Test in Europe, 2006
2005
Αποδοτικές τεχνικές ενσωματωμένης αυτοδοκιμής για επεξεργαστές τεχνολογίας CMOS VLSI βασισμένες στην αρχιτεκτονική του συνόλου εντολών
PhD thesis, 2005
IEEE Trans. Reliab., 2005
2003
Application and Analysis of RT-Level Software-Based Self-Testing for Embedded Processor Cores.
Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003
Proceedings of the 9th IEEE International On-Line Testing Symposium (IOLTS 2003), 2003
Proceedings of the 2003 Design, 2003
2002
Proceedings of the 2002 Design, 2002
2001
J. Electron. Test., 2001
Robust and Low-Cost BIST Architectures for Sequential Fault Testing in Datapath Multipliers.
Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001
Proceedings of the Conference on Design, Automation and Test in Europe, 2001
2000
IEEE Des. Test Comput., 2000
Proceedings of the 18th IEEE VLSI Test Symposium (VTS 2000), 30 April, 2000
Deterministic Built-In Self -Test for Shifters, Adders and ALUs in Datapaths.
Proceedings of the 1st Latin American Test Workshop, 2000
1999
Proceedings of the 1999 Design, 1999