Nektar Xama

According to our database, Nektar Xama authored at least 16 papers between 2017 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs Using SVM Classifiers.

Nektar Xama, Jhon Gomez, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., October, 2023

High-coverage analog IP block test generation methodology using low-cost signal generation and output response analysis.

Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen

Proceedings of the IEEE European Test Symposium, 2023

2022

DDtM: Increasing Latent Defect Detection in Analog/Mixed-Signal ICs Using the Difference in Distance to Mean Value.

Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

2020

Machine Learning-based Defect Coverage Boosting of Analog Circuits under Measurement Variations.

Nektar Xama, Martin Andraud, Jhon Gomez, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen

ACM Trans. Design Autom. Electr. Syst., 2020

Pinhole Latent Defect Modeling and Simulation for Defect-Oriented Analog/Mixed-Signal Testing.

Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen

Proceedings of the 38th IEEE VLSI Test Symposium, 2020

Quick Analyses for Improving Reliability and Functional Safety of Mixed-Signal ICs.

Stephen Sunter, Michal Wolinski, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Nektar Xama, Jhon Gomez, Georges G. E. Gielen

Proceedings of the IEEE International Test Conference, 2020

Avoiding Mixed-Signal Field Returns by Outlier Detection of Hard-to-Detect Defects based on Multivariate Statistics.

Nektar Xama, Jakob Raymaekers, Martin Andraud, Jhon Gomez, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen

Proceedings of the IEEE European Test Symposium, 2020

Latent Defect Screening with Visually-Enhanced Dynamic Part Average Testing.

Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, Nektar Xama, Jhon Gomez, Georges G. E. Gielen

Proceedings of the IEEE European Test Symposium, 2020

2019

Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs.

Wim Dobbelaere, Frederik Colle, Anthony Coyette, Ronny Vanhooren, Nektar Xama, Jhon Gomez, Georges G. E. Gielen

Proceedings of the IEEE International Test Conference, 2019

Review of Methodologies for Pre- and Post-Silicon Analog Verification in Mixed-Signal SOCs.

Georges G. E. Gielen, Nektar Xama, Karthik Ganesan, Subhasish Mitra

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2019

2018

An Automated Low-Cost Analog and Mixed-Signal DfT Method Using Testing Diodes.

Baris Esen, Anthony Coyette, Nektar Xama, Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren

IEEE Des. Test, 2018

ADAGE: Automatic DfT-Assisted Generation of Test Stimuli for Mixed- Signal Integrated Circuits.

Anthony Coyette, Baris Esen, Nektar Xama, Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren

IEEE Des. Test, 2018

Methodology Towards Sub-ppm Testing of Analog and Mixed-Signal ICs for Cyber-Physical Systems.

Georges G. E. Gielen, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Nektar Xama

Proceedings of the IEEE International Symposium on Circuits and Systems, 2018

2017

Non-intrusive detection of defects in mixed-signal integrated circuits using light activation.

Baris Esen, Anthony Coyette, Nektar Xama, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen

Proceedings of the IEEE International Test Conference, 2017

Automatic testing of analog ICs for latent defects using topology modification.

Nektar Xama, Anthony Coyette, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen

Proceedings of the 22nd IEEE European Test Symposium, 2017

A very low cost and highly parallel DfT method for analog and mixed-signal circuits.

Baris Esen, Anthony Coyette, Nektar Xama, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen

Proceedings of the 22nd IEEE European Test Symposium, 2017