Neil G. Jacobson

According to our database, Neil G. Jacobson authored at least 4 papers between 2000 and 2020.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2020

High-speed I/O capabilities added to military automatic test equipment (ATE) using synthetic instruments.

Louis Y. Ungar, Neil G. Jacobson, T. M. Mak

IEEE Instrum. Meas. Mag., 2020

2008

Boundary-Scan Testing of Power/Ground Pins.

Kenneth P. Parker, Neil G. Jacobson

Proceedings of the 2008 IEEE International Test Conference, 2008

2004

Status of IEEE Testability Standards 1149.4, 1532 and 1149.6.

Stephen K. Sunter, Adam Osseiran, Adam Cron, Neil G. Jacobson, Dave Bonnett, Bill Eklow, Carl Barnhart, Ben Bennetts

Proceedings of the 2004 Design, 2004

2000

Streamlining programmable device and system test using IEEE Std 1532.

Neil G. Jacobson

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000