Naveen John Punnoose

Orcid: 0000-0001-8428-903X

According to our database1, Naveen John Punnoose authored at least 2 papers between 2018 and 2021.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

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PhD thesis 
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Links

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Bibliography

2021
Data-driven Quality Estimation for Production Processes with Lot-level Quality Control.
Proceedings of the IECON 2021, 2021

2018
An Ensemble of fuzzy Class-Biased Networks for Product Quality Estimation.
Proceedings of the 23rd IEEE International Conference on Emerging Technologies and Factory Automation, 2018


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