Narendra Parihar

According to our database1, Narendra Parihar authored at least 9 papers between 2010 and 2020.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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Links

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Bibliography

2020
Analysis of The Hole Trapping Detrapping Component of NBTI Over Extended Temperature Range.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019
Modeling the Interdependences Between Voltage Fluctuation and BTI Aging.
IEEE Trans. Very Large Scale Integr. Syst., 2019

On the Frequency Dependence of Bulk Trap Generation During AC Stress in Si and SiGe RMG P-FinFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018
A review of NBTI mechanisms and models.
Microelectron. Reliab., 2018

Prediction of NBTI stress and recovery time kinetics in Si capped SiGe p-MOSFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2018

Key parameters driving transistor degradation in advanced strained SiGe channels.
Proceedings of the IEEE International Reliability Physics Symposium, 2018

2016
Analysis and Modeling of Stress over Layer Induced Threshold Voltage Shift in HKMG nMOS Transistors.
Proceedings of the 29th International Conference on VLSI Design and 15th International Conference on Embedded Systems, 2016

Aging-aware voltage scaling.
Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition, 2016

2010
A Split Driver Approach to Soc Virtualization - Challenges and Opportunities.
Proceedings of the 39th International Conference on Parallel Processing, 2010


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