Naoko Misawa
Orcid: 0000-0001-9362-803X
According to our database1,
Naoko Misawa
authored at least 12 papers
between 2021 and 2024.
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Bibliography
2024
Comprehensive Analysis of Read Fluctuations in ReRAM CiM by Using Fluctuation Pattern Classifier.
IEICE Trans. Electron., 2024
REM-CiM: Attentional RGB-Event Fusion Multi-Modal Analog CiM for Area/Energy-Efficient Edge Object Detection during Both Day and Night.
IEICE Trans. Electron., 2024
Embedded Transformer Hetero-CiM: SRAM CiM for 4b Read/Write-MAC Self-attention and MLC ReRAM CiM for 6b Read-MAC Linear&FC Layers.
Proceedings of the IEEE International Memory Workshop, 2024
2023
Write Variation & Reliability Error Compensation by Layer-Wise Tunable Retraining of Edge FeFET LM-GA CiM.
IEICE Trans. Electron., July, 2023
ReRAM CiM Fluctuation Pattern Classification by CNN Trained on Artificially Created Dataset.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
Stochastic Computing-based Computation-in-Memory (SC CiM) Architecture for DNNs and Hierarchical Evaluations of Non-volatile Memory Error and Defect Tolerance.
Proceedings of the IEEE International Memory Workshop, 2023
LIORAT: NN Layer I/O Range Training for Area/Energy-Efficient Low-Bit A/D Conversion System Design in Error-Tolerant Computation-in-Memory.
Proceedings of the IEEE/ACM International Conference on Computer Aided Design, 2023
2022
PLoS Comput. Biol., 2022
Edge Computation-in-Memory for In-situ Class-incremental Learning with Knowledge Distillation.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2022
Domain Specific ReRAM Computation-in-Memory Design Considering Bit Precision and Memory Errors for Simulated Annealing.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2022
Edge Retraining of FeFET LM-GA CiM for Write Variation & Reliability Error Compensation.
Proceedings of the IEEE International Memory Workshop, 2022
2021
Simulated Annealing Algorithm & ReRAM Device Co-optimization for Computation-in-Memory.
Proceedings of the IEEE International Memory Workshop, 2021