Naoki Kasai

According to our database, Naoki Kasai authored at least 11 papers between 2001 and 2014.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2014

10.5 A 90nm 20MHz fully nonvolatile microcontroller for standby-power-critical applications.

Noboru Sakimura, Yukihide Tsuji, Ryusuke Nebashi, Hiroaki Honjo, Ayuka Morioka, Kunihiko Ishihara, Keizo Kinoshita, Shunsuke Fukami, Sadahiko Miura, Naoki Kasai, Tetsuo Endoh, Hideo Ohno, Takahiro Hanyu, Tadahiko Sugibayashi

Proceedings of the 2014 IEEE International Conference on Solid-State Circuits Conference, 2014

A delay circuit with 4-terminal magnetic-random-access-memory device for power-efficient time- domain signal processing.

Ryusuke Nebashi, Noboru Sakimura, Hiroaki Honjo, Ayuka Morioka, Yukihide Tsuji, Kunihiko Ishihara, Keiichi Tokutome, Sadahiko Miura, Shunsuke Fukami, Keizo Kinoshita, Takahiro Hanyu, Tetsuo Endoh, Naoki Kasai, Hideo Ohno, Tadahiko Sugibayashi

Proceedings of the IEEE International Symposium on Circuits and Systemss, 2014

2009

Nonvolatile Magnetic Flip-Flop for Standby-Power-Free SoCs.

Noboru Sakimura, Tadahiko Sugibayashi, Ryusuke Nebashi, Naoki Kasai

IEEE J. Solid State Circuits, 2009

Shared Write-Selection Transistor Cell and Leakage-Replication Read Scheme for Large Capacity MRAM Macros.

Ryusuke Nebashi, Noboru Sakimura, Tadahiko Sugibayashi, Naoki Kasai

IEICE Trans. Electron., 2009

A 90nm 12ns 32Mb 2T1MTJ MRAM.

Ryusuke Nebashi, Noboru Sakimura, Hiroaki Honjo, Shinsaku Saito, Yuichi Ito, Sadahiko Miura, Yuko Kato, Kaoru Mori, Yasuaki Ozaki, Yosuke Kobayashi, Norikazu Ohshima, Keizo Kinoshita, Tetsuhiro Suzuki, Kiyokazu Nagahara, Nobuyuki Ishiwata, Katsumi Suemitsu, Shunsuke Fukami, Hiromitsu Hada, Tadahiko Sugibayashi, Naoki Kasai

Proceedings of the IEEE International Solid-State Circuits Conference, 2009

2007

A 16-Mb Toggle MRAM With Burst Modes.

Tadahiko Sugibayashi, Noboru Sakimura, Takeshi Honda, Kiyokazu Nagahara, Kiyotaka Tsuji, Hideaki Numata, Sadahiko Miura, Ken-ichi Shimura, Yuko Kato, Shinsaku Saito, Yoshiyuki Fukumoto, Hiroaki Honjo, Tetsuhiro Suzuki, Katsumi Suemitsu, Tomonori Mukai, Kaoru Mori, Ryusuke Nebashi, Shunsuke Fukami, Norikazu Ohshima, Hiromitsu Hada, Nobuyuki Ishiwata, Naoki Kasai, Shuichi Tahara

IEEE J. Solid State Circuits, 2007

MRAM Applications Using Unlimited Write Endurance.

Tadahiko Sugibayashi, Takeshi Honda, Noboru Sakimura, Shuichi Tahara, Naoki Kasai

IEICE Trans. Electron., 2007

Writing Circuitry for Toggle MRAM to Screen Intermittent Failure Mode.

Takeshi Honda, Noboru Sakimura, Tadahiko Sugibayashi, Naoki Kasai, Hiromitsu Hada, Shuichi Tahara

IEICE Trans. Electron., 2007

2005

Gate-Last MISFET Structures and Process for Characterization of High-k and Metal Gate MISFETs.

Takeo Matsuki, Kazuyoshi Torii, Takeshi Maeda, Yasushi Akasaka, Kiyoshi Hayashi, Naoki Kasai, Tsunetoshi Arikado

IEICE Trans. Electron., 2005

Special Section on Microelectronic Test Structures.

Naoki Kasai

IEICE Trans. Electron., 2005

2001

FeRAM device and circuit technologies fully compatible with advanced CMOS.

Hideo Toyoshima, Sota Kobayashi, Junichi Yamada, Tohru Miwa, Hiroki Koike, Hidenori Takeuchi, Hidemitsu Mori, Naoki Kasai, Yukihiko Maejima, Nobuhira Tanabe, Toru Tatsumi, Hiromitsu Hada

Proceedings of the IEEE 2001 Custom Integrated Circuits Conference, 2001