Naohito Yoshida

According to our database, Naohito Yoshida authored at least 3 papers between 2005 and 2010.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2010

Simultaneous achievement of high performance and high reliability in a 38/77GHz InGaAs/AlGaAs PHEMT MMIC.

Takayuki Hisaka, Hajime Sasaki, Takayuki Kato, Ko Kanaya, Naohito Yoshida, Anita A. Villanueva, Jesús A. del Alamo

IEICE Electron. Express, 2010

2009

Corrosion-induced degradation of GaAs PHEMTs under operation in high humidity conditions.

Takayuki Hisaka, Hajime Sasaki, Yoichi Nogami, Kenji Hosogi, Naohito Yoshida, Anita A. Villanueva, Jesús A. del Alamo, Shigehiko Hasegawa, Hajime Asahi

Microelectron. Reliab., 2009

2005

Degradation mechanisms of GaAs PHEMTs in high humidity conditions.

Takayuki Hisaka, Yasuki Aihara, Yoichi Nogami, Hajime Sasaki, Yasushi Uehara, Naohito Yoshida, Kazuo Hayashi

Microelectron. Reliab., 2005