Nanditha P. Rao

Orcid: 0000-0003-2369-0836

According to our database1, Nanditha P. Rao authored at least 15 papers between 2014 and 2024.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

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PhD thesis 
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Links

On csauthors.net:

Bibliography

2024
ConvMap: Boosting Convolution Throughput on FPGAs with Efficient Resource Mapping.
Proceedings of the IEEE International Parallel and Distributed Processing Symposium, 2024

2023
MCSim: A Multi-Core Cache Simulator Accelerated on a Resource-constrained FPGA.
Proceedings of the Great Lakes Symposium on VLSI 2023, 2023

2022
Cacheaccel_Simulator.
Dataset, February, 2022

FastMem: A Fast Architecture-aware Memory Layout Design.
Proceedings of the 23rd International Symposium on Quality Electronic Design, 2022

An Automated Approach to Compare Bit Serial and Bit Parallel In-Memory Computing for DNNs.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2022

An FPGA based Tiled Systolic Array Generator to Accelerate CNNs.
Proceedings of the 25th Euromicro Conference on Digital System Design, 2022

2021
Variable Bit-Precision Vector Extension for RISC-V Based Processors.
Proceedings of the 14th IEEE International Symposium on Embedded Multicore/Many-core Systems-on-Chip, 2021

FPGA Accelerated Parameterized Cache Simulator.
Proceedings of the 22nd International Symposium on Quality Electronic Design, 2021

Flush-Reload Attack and its Mitigation on an FPGA Based Compressed Cache Design.
Proceedings of the 22nd International Symposium on Quality Electronic Design, 2021

Cache-accel: FPGA Accelerated Cache Simulator with Partially Reconfigurable Prefetcher.
Proceedings of the 24th Euromicro Conference on Digital System Design, 2021

2018
Quantification of the likelihood of single event multiple transients in logic circuits in bulk CMOS technology.
Microelectron. J., 2018

2017
Neutron-induced strike: Study of multiple node charge collection in 14nm FinFETs.
CoRR, 2017

2016
Higher likelihood of multiple bit-flips due to neutron-induced strikes on logic gates.
CoRR, 2016

2015
A Detailed Characterization of Errors in Logic Circuits due to Single-Event Transients.
Proceedings of the 2015 Euromicro Conference on Digital System Design, 2015

2014
On the likelihood of multiple bit upsets in logic circuits.
CoRR, 2014


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