Nam-Hyun Lee

According to our database, Nam-Hyun Lee authored at least 11 papers between 2016 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Cryogenic Body Bias Effect in DRAM Peripheral and Buried-Channel-Array Transistor for Quantum Computing Applications.

Hyunseo You, Kihoon Nam, Jehyun An, Chanyang Park, Donghyun Kim, Seonhaeng Lee, Namhyun Lee, Rock-Hyun Baek

IEEE Access, 2024

Current-Voltage Modeling of DRAM Cell Transistor Using Genetic Algorithm and Deep Learning.

Jun Hui Park, Jung Nam Kim, Seonhaeng Lee, Gang-Jun Kim, Namhyun Lee, Rock-Hyun Baek, Dae Hwan Kim, Changhyun Kim, Myounggon Kang, Yoon Kim

IEEE Access, 2024

Effect of Off-State Stress on Data-Valid Window Margin for Advanced DRAM Using HK/MG Process Technology.

Sunhang Lee, Nam-Hyun Lee, G.-J. Kim, J. Ahn, Ik-Hwan Kim, S. Ha, S. Rhee, GH Bae, KW Lee, YS Lee, SB. Ko, S. Pae

Proceedings of the IEEE International Reliability Physics Symposium, 2024

2022

Transistor Reliability Characterization for Advanced DRAM with HK+MG & EUV process technology.

Nam-Hyun Lee, Sunhang Lee, S.-H. Kim, G.-J. Kim, K. W. Lee, Y. S. Lee, Y. C. Hwang, H. S. Kim, S. Pae

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021

Effect of High Temperature on Recovery of Hot Carrier Degradation of scaled nMOSFETs in DRAM.

Donghee Son, Gang-Jun Kim, Jongkyun Kim, Nam-Hyun Lee, Kijin Kim, Sangwoo Pae

Proceedings of the IEEE International Reliability Physics Symposium, 2021

The Characterization of Degradation on various SiON pMOSFET transistors under AC/DC NBTI stress.

Gang-Jun Kim, Moonjee Yoon, SungHwan Kim, Myeongkyu Eo, Shinhyung Kim, Taehun You, Namhyun Lee, Kijin Kim, Sangwoo Pae

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2019

Comprehensive Study for OFF-State Hot Carrier Degrdation of Scaled nMOSFETs in DRAM.

Nam-Hyun Lee, Jongkyun Kim, Donghee Son, Kangjun Kim, Jung Eun Seok

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

Effect of DC/AC stress on the reliability of cell capacitor in DRAM.

Gang-Jun Kim, Nam-Hyun Lee, Jongkyun Kim, Jung Eun Seok, Yunsung Lee

Microelectron. Reliab., 2018

Effect of OFF-state stress on reliability of nMOSFET in SWD circuits of DRAM.

Jongkyun Kim, Namhyun Lee, Gang-Jun Kim, Young-Yun Lee, Jung-Eun Seok, Yunsung Lee

Microelectron. Reliab., 2018

2016

Channel width dependence of AC stress on bulk nMOSFETs.

Donghee Son, Gang-Jun Kim, Ji-Hoon Seo, Nam-Hyun Lee, YongHa Kang, Bongkoo Kang

Microelectron. Reliab., 2016

Degradation of pMOSFETs due to hot electron induced punchthrough.

Donghee Son, Gang-Jun Kim, Ji-Hoon Seo, Nam-Hyun Lee, YongHa Kang, Bongkoo Kang

Microelectron. Reliab., 2016