Nagothu Karmel Kranthi

According to our database1, Nagothu Karmel Kranthi authored at least 10 papers between 2018 and 2023.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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Bibliography

2023
Impact of Thin-oxide Gate on the On-Resistance of HV-PNP Under ESD Stress.
Proceedings of the IEEE International Reliability Physics Symposium, 2023

Current Scalability Issues in Multi-Bank 5V PMOS ESD structures: Root cause and Design Guideline.
Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022
Effect of Source & Drain Side Abutting on the Low Current Filamentation in LDMOS-SCR Devices.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

2020
Design Insights to Address Low Current ESD Failure and Power Scalability Issues in High Voltage LDMOS-SCR Devices.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

How to Achieve Moving Current Filament in High Voltage LDMOS Devices: Physical Insights & Design Guidelines for Self-Protected Concepts.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019
First Demonstration and Physical Insights into Time-Dependent Breakdown of Graphene Channel and Interconnects.
Proceedings of the IEEE International Reliability Physics Symposium, 2019

Current Filament Dynamics Under ESD Stress in High Voltage (Bidirectional) SCRs and It's Implications on Power Law Behavior.
Proceedings of the IEEE International Reliability Physics Symposium, 2019

Physical Insights into the Low Current ESD Failure of LDMOS-SCR and its Implication on Power Scalability.
Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018
On the ESD Reliability Issues in Carbon Electronics: Graphene and Carbon Nano Tubes.
Proceedings of the 31st International Conference on VLSI Design and 17th International Conference on Embedded Systems, 2018

Defect-Assisted Safe Operating Area Limits and High Current Failure in Graphene FETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2018


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