Nagarajan Raghavan
Orcid: 0000-0001-6735-3108
According to our database1,
Nagarajan Raghavan
authored at least 62 papers
between 2007 and 2024.
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Bibliography
2024
Successive Multi-Stage Compliance-Ramp Voltage Sweep Methodology (MSC-RVS) for Understanding the Evolution of Gate Breakdown Mechanisms in p-GaN HEMTs.
IEEE Access, 2024
2023
Development of a surrogate model for high-fidelity laser powder-bed fusion using tensor train and gaussian process regression.
J. Intell. Manuf., 2023
Investigating Knowledge Structure and Future Directions in IT-Based Business Methods Using Hierarchical Main Path Approach.
IEEE Access, 2023
A New Methodology to Precisely Induce Wake-Up for Reliability Assessment of Ferroelectric Devices.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
Proceedings of the IEEE International Reliability Physics Symposium, 2023
2022
Remaining Useful Life Prediction of Lithium-Ion Batteries Using Neural Networks with Adaptive Bayesian Learning.
Sensors, 2022
Global Optimization of Surface Warpage for Inverse Design of Ultra-Thin Electronic Packages Using Tensor Train Decomposition.
IEEE Access, 2022
Neuromorphic In-Memory RRAM NAND/NOR Circuit Performance Analysis in a CNN Training Framework on the Edge for Low Power IoT.
IEEE Access, 2022
2021
Hierarchical main path analysis to identify decompositional multi-knowledge trajectories.
J. Knowl. Manag., 2021
Inverse Design for Low Warpage Ultra-Thin Packages Using Constrained Particle Swarm Optimization.
IEEE Access, 2021
Predicting Lumen Degradation of Light Emitting Diodes Using Hybrid Particle Filter Trained Neural Networks.
IEEE Access, 2021
Hybrid Particle Filter Trained Neural Network for Prognosis of Lithium-Ion Batteries.
IEEE Access, 2021
Computational Failure Analysis of In-Memory RRAM Architecture for Pattern Classification CNN Circuits.
IEEE Access, 2021
Developmental Trajectories in Blockchain Technology Using Patent-Based Knowledge Network Analysis.
IEEE Access, 2021
Semiconductor Manufacturing Final Test Yield Optimization and Wafer Acceptance Test Parameter Inverse Design Using Multi-Objective Optimization Algorithms.
IEEE Access, 2021
A Gaussian Mixture Model Clustering Ensemble Regressor for Semiconductor Manufacturing Final Test Yield Prediction.
IEEE Access, 2021
Bias Suppression Framework for Detrending Mean of Multi-Output Gaussian Process Regression in LED Remaining Storage Life Prognosis.
IEEE Access, 2021
Condition Based Maintenance Policy for Crankcase Lubricating Oil in Diesel Locomotives.
Proceedings of the IEEE International Conference on Industrial Engineering and Engineering Management, 2021
2020
Lubricating Oil Remaining Useful Life Prediction Using Multi-Output Gaussian Process Regression.
IEEE Access, 2020
Learning Localized Spatial Material Properties of Substrates in Ultra-Thin Packages Using Markov Chain Monte Carlo and Finite Element Analysis.
IEEE Access, 2020
Piecewise Model-Based Online Prognosis of Lithium-Ion Batteries Using Particle Filters.
IEEE Access, 2020
A Novel Framework for Semiconductor Manufacturing Final Test Yield Classification Using Machine Learning Techniques.
IEEE Access, 2020
Data Driven Prognosis of Fracture Dynamics Using Tensor Train and Gaussian Process Regression.
IEEE Access, 2020
Reliability and Breakdown Study of Erase Gate Oxide in Split-Gate Non-Volatile Memory Device.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
Correlation of Dielectric Breakdown and Nanoscale Adhesion in Silicon Dioxide Thin Films.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
2019
Dielectric Breakdown in 2D Layered Hexagonal Boron Nitride - The Knowns and the Unknowns.
Proceedings of the IEEE International Reliability Physics Symposium, 2019
Proceedings of the IEEE International Reliability Physics Symposium, 2019
Spatio-Temporal Defect Generation Process in Irradiated HfO2 MOS Stacks: Correlated Versus Uncorrelated Mechanisms.
Proceedings of the IEEE International Reliability Physics Symposium, 2019
2018
Comparison of experimental, analytical and simulation methods to estimate substrate material properties for warpage reliability analysis.
Microelectron. Reliab., 2018
A holistic comparison of the different resampling algorithms for particle filter based prognosis using lithium ion batteries as a case study.
Microelectron. Reliab., 2018
Statistical nature of hard breakdown recovery in high-κ dielectric stacks studied using ramped voltage stress.
Microelectron. Reliab., 2018
Gaussian process regression approach for robust design and yield enhancement of self-assembled nanostructures.
Microelectron. Reliab., 2018
Heuristic Kalman optimized particle filter for remaining useful life prediction of lithium-ion battery.
Microelectron. Reliab., 2018
Application of multi-output Gaussian process regression for remaining useful life prediction of light emitting diodes.
Microelectron. Reliab., 2018
Application of expectation maximization and Kalman smoothing for prognosis of lumen maintenance life for light emitting diodes.
Microelectron. Reliab., 2018
Proceedings of the IEEE International Reliability Physics Symposium, 2018
Proceedings of the IEEE International Reliability Physics Symposium, 2018
2017
Uncertainty quantification in nanowire growth modeling - A precursor to quality semiconductor nanomanufacturing.
Microelectron. Reliab., 2017
Application of multiplicative dimensional reduction method for uncertainty quantification and sensitivity analysis of MEMS electrostatic actuators.
Microelectron. Reliab., 2017
A metaheuristic approach to remaining useful life estimation of systems subject to multiple degradation mechanisms.
Proceedings of the 2017 IEEE International Conference on Prognostics and Health Management, 2017
Proceedings of the 2017 IEEE International Conference on Prognostics and Health Management, 2017
2016
Conductive filament formation at grain boundary locations in polycrystalline HfO<sub>2</sub> -based MIM stacks: Computational and physical insight.
Microelectron. Reliab., 2016
Analysis of quantum conductance, read disturb and switching statistics in HfO<sub>2</sub> RRAM using conductive AFM.
Microelectron. Reliab., 2016
Application of the defect clustering model for forming, SET and RESET statistics in RRAM devices.
Microelectron. Reliab., 2016
Compliance current dominates evolution of NiSi<sub>2</sub> defect size in Ni/dielectric/Si RRAM devices.
Microelectron. Reliab., 2016
2015
An SEM/STM based nanoprobing and TEM study of breakdown locations in HfO<sub>2</sub>/SiO<sub>x</sub> dielectric stacks for failure analysis.
Microelectron. Reliab., 2015
Statistics of retention failure in the low resistance state for hafnium oxide RRAM using a Kinetic Monte Carlo approach.
Microelectron. Reliab., 2015
Particle filter approach to lifetime prediction for microelectronic devices and systems with multiple failure mechanisms.
Microelectron. Reliab., 2015
Probabilistic insight to possibility of new metal filament nucleation during repeated cycling of conducting bridge memory.
Microelectron. Reliab., 2015
Monte Carlo model of reset stochastics and failure rate estimation of read disturb mechanism in HfOx RRAM.
Proceedings of the IEEE International Reliability Physics Symposium, 2015
Spectroscopy of SILC trap locations and spatial correlation study of percolation path in the high-κ and interfacial layer.
Proceedings of the IEEE International Reliability Physics Symposium, 2015
Remaining useful life estimation for systems subject to multiple degradation mechanisms.
Proceedings of the 2015 IEEE Conference on Prognostics and Health Management, 2015
2014
Impact of local structural and electrical properties of grain boundaries in polycrystalline HfO<sub>2</sub> on reliability of SiO<sub>x</sub> interfacial layer.
Microelectron. Reliab., 2014
High-κ dielectric breakdown in nanoscale logic devices - Scientific insight and technology impact.
Microelectron. Reliab., 2014
Prognostic methodology for remaining useful life estimation of retention loss in nanoscale resistive switching memory.
Microelectron. Reliab., 2014
Assessment of read disturb immunity in conducting bridge memory devices - A thermodynamic perspective.
Microelectron. Reliab., 2014
Variability model for forming process in oxygen vacancy modulated high-κ based resistive switching memory devices.
Microelectron. Reliab., 2014
2009
Reply to comments on "A framework to practical predictive maintenance modeling for multi-state systems".
Reliab. Eng. Syst. Saf., 2009
2008
Reliab. Eng. Syst. Saf., 2008
2007
Microelectron. Reliab., 2007