Nadir Z. Basturkmen

According to our database, Nadir Z. Basturkmen authored at least 5 papers between 1999 and 2008.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2008

Diagnosis of Scan Clock Failures.

King Leong Lee, Nadir Z. Basturkmen, Srikanth Venkataraman

Proceedings of the 26th IEEE VLSI Test Symposium (VTS 2008), April 27, 2008

2003

A Low Power Pseudo-Random BIST Technique.

Nadir Z. Basturkmen, Sudhakar M. Reddy, Irith Pomeranz

J. Electron. Test., 2003

2002

Improved Algorithms for Constructive Multi-Phase Test Point Insertion for Scan Based BIST.

Nadir Z. Basturkmen, Sudhakar M. Reddy, Janusz Rajski

Proceedings of the 7th Asia and South Pacific Design Automation Conference (ASP-DAC 2002), 2002

Pseudo Random Patterns Using Markov Sources for Scan BIST.

Nadir Z. Basturkmen, Sudhakar M. Reddy, Irith Pomeranz

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

1999

Procedures for Identifying Undetectable and Redundant Faults In Synchronous Sequential Circuits.

Sudhakar M. Reddy, Irith Pomeranz, Nadir Z. Basturkmen, Xijiang Lin

Proceedings of the 17th IEEE VLSI Test Symposium (VTS '99), 1999