Nadine Buard

According to our database, Nadine Buard authored at least 8 papers between 2003 and 2009.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2009

Novel DRAM mitigation technique.

Antonin Bougerol, Florent Miller, Nadine Buard

Proceedings of the 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 2009

2008

SDRAM Architecture & Single Event Effects Revealed with Laser.

Antonin Bougerol, Florent Miller, Nadine Buard

Proceedings of the 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 2008

2007

Multiple Event Transient Induced by Nuclear Reactions in CMOS Logic Cells.

Claudia Rusu, Antonin Bougerol, Lorena Anghel, Cécile Weulersse, Nadine Buard, S. Benhammadi, Nicolas Renaud, Guillaume Hubert, Frederic Wrobel, Thierry Carrière, Rémi Gaillard

Proceedings of the 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007

Latchup effect in CMOS IC: a solution for crypto-processors protection against fault injection attacks?

Nadine Buard, Florent Miller, Cédric Ruby, Rémi Gaillard

Proceedings of the 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007

2006

Prediction of Transient Induced by Neutron/Proton in CMOS Combinational Logic Cells.

Guillaume Hubert, Antonin Bougerol, Florent Miller, Nadine Buard, Lorena Anghel, Thierry Carrière, Frederic Wrobel, Rémi Gaillard

Proceedings of the 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 2006

From Nuclear Reaction to System Failures: Can We Address All Levels of Soft Errors Accurately?

Lorena Anghel, Michael Nicolaidis, Nadine Buard

Proceedings of the 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 2006

2005

A Review of DASIE Code Family: Contribution to SEU/MBU Understanding.

Guillaume Hubert, Nadine Buard, Cécile Weulersse, Thierry Carrière, Marie-Catherine Palau, Jean-Marie Palau, Damien Lambert, Jacques Baggio, Frederic Wrobel, Frédéric Saigné, Rémi Gaillard

Proceedings of the 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 2005

2003

Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects.

Frédéric Darracq, Hervé Lapuyade, Nadine Buard, Pascal Fouillat, R. Dufayel, Thierry Carrière

Microelectron. Reliab., 2003