N. Tam

According to our database¹, N. Tam authored at least 2 papers in 2015.

Collaborative distances:

Dijkstra number² of five.
Erdős number³ of five.

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2015

Multi-cell soft errors at the 16-nm FinFET technology node.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Reliability Physics Symposium, 2015

Terrestrial SER characterization for nanoscale technologies: A comparative study.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Reliability Physics Symposium, 2015

N. Tam

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