N. Bicaïs-Lépinay

According to our database, N. Bicaïs-Lépinay authored at least 2 papers between 2002 and 2006.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2006

Electron BackScattered Diffraction (EBSD) use and applications in newest technologies development.

S. Courtas, M. Grégoire, X. Federspiel, N. Bicaïs-Lépinay, C. Wyon

Microelectron. Reliab., 2006

2002

Lift-out techniques coupled with advanced TEM characterization methods for electrical failure analysis.

N. Bicaïs-Lépinay, F. André, R. Pantel, S. Jullian, Alain Margain, L. F. Tz. Kwakman

Microelectron. Reliab., 2002