Myung-Hoon Yang

According to our database, Myung-Hoon Yang authored at least 8 papers between 2005 and 2010.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2010

EOF: Efficient Built-In Redundancy Analysis Methodology With Optimal Repair Rate.

Myung-Hoon Yang, Hyungjun Cho, Wooheon Kang, Sungho Kang

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2010

2009

Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time.

YongJoon Kim, Myung-Hoon Yang, Jaeseok Park, Eunsei Park, Sungho Kang

IEICE Trans. Inf. Syst., 2009

2008

An Effective Power Reduction Methodology for Deterministic BIST Using Auxiliary LFSR.

Myung-Hoon Yang, YongJoon Kim, Sunghoon Chun, Sungho Kang

J. Electron. Test., 2008

An Effective Hybrid Test Data Compression Method Using Scan Chain Compaction and Dictionary-Based Scheme.

Taejin Kim, Sunghoon Chun, YongJoon Kim, Myung-Hoon Yang, Sungho Kang

Proceedings of the 17th IEEE Asian Test Symposium, 2008

XPDF-ATPG: An Efficient Test Pattern Generation for Crosstalk-Induced Faults.

Sunghoon Chun, YongJoon Kim, Taejin Kim, Myung-Hoon Yang, Sungho Kang

Proceedings of the 17th IEEE Asian Test Symposium, 2008

2007

Deterministic built-in self-test using split linear feedback shift register reseeding for low-power testing.

Myung-Hoon Yang, Youbean Kim, Youngkyu Park, D. Lee, Sungho Kang

IET Comput. Digit. Tech., 2007

2006

An Effective Test Pattern Generation for Testing Signal Integrity.

YongJoon Kim, Myung-Hoon Yang, Youngkyu Park, Daeyeal Lee, Sungho Kang

Proceedings of the 15th Asian Test Symposium, 2006

2005

A New Low Power Test Pattern Generator using a Transition Monitoring Window based on BIST Architecture.

Youbean Kim, Myung-Hoon Yang, Yong Lee, Sungho Kang

Proceedings of the 14th Asian Test Symposium (ATS 2005), 2005