Mustapha Slamani

According to our database, Mustapha Slamani authored at least 37 papers between 1992 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

Signal Integrity Analysis and Optimization of DDR Interconnect Design.

Xiaozhe Fan, Swathi Manamohan, Mustapha Slamani, John Ferrario, Murugan Muthukaruppan

Proceedings of the IEEE International Conference on Consumer Electronics, 2024

2016

OFDM Multitone Signal Generation Technique for Analog Circuitry Test Characterization.

Nicholai L'Esperance, Timothy Platt, Mustapha Slamani, Tian Xia

IEEE Trans. Circuits Syst. II Express Briefs, 2016

2015

Built-In Self-Test of Transmitter I/Q Mismatch and Nonlinearity Using Self-Mixing Envelope Detector.

Afsaneh Nassery, Srinath Byregowda, Sule Ozev, Marian Verhelst, Mustapha Slamani

IEEE Trans. Very Large Scale Integr. Syst., 2015

2014

Continuous wave radar circuitry testing using OFDM technique.

Mohamed Metwally, Nicholai L'Esperance, Tian Xia, Mustapha Slamani

Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

Built-in self-test and characterization of polar transmitter parameters in the loop-back mode.

Jae Woong Jeong, Sule Ozev, Shreyas Sen, Vishwanath Natarajan, Mustapha Slamani

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

2013

Low Cost Time Efficient Multi-tone Test Signal Generation Using OFDM Technique.

Tian Xia, Rohit Shetty, Timothy Platt, Mustapha Slamani

J. Electron. Test., 2013

Analytical modeling for EVM in OFDM transmitters including the effects of IIP3, I/Q imbalance, noise, AM/AM and AM/PM distortion.

Afsaneh Nassery, Sule Ozev, Mustapha Slamani

Proceedings of the 18th IEEE European Test Symposium, 2013

2012

Built-in-Self Test of transmitter I/Q mismatch using self-mixing envelope detector.

Afsaneh Nassery, Srinath Byregowda, Sule Ozev, Marian Verhelst, Mustapha Slamani

Proceedings of the 30th IEEE VLSI Test Symposium, 2012

Analog/RF test ordering in the early stages of production testing.

Nourredine Akkouche, Salvador Mir, Emmanuel Simeu, Mustapha Slamani

Proceedings of the 30th IEEE VLSI Test Symposium, 2012

2011

Extraction of EVM from Transmitter System Parameters.

Afsaneh Nassery, Sule Ozev, Marian Verhelst, Mustapha Slamani

Proceedings of the 16th European Test Symposium, 2011

Correlating inline data with final test outcomes in analog/RF devices.

Nathan Kupp, Mustapha Slamani, Yiorgos Makris

Proceedings of the Design, Automation and Test in Europe, 2011

2010

RF Specification Test Compaction Using Learning Machines.

Haralampos-G. D. Stratigopoulos, Petros Drineas, Mustapha Slamani, Yiorgos Makris

IEEE Trans. Very Large Scale Integr. Syst., 2010

Synthetic DSP approach for novel FPGA-based measurement of error vector magnitude.

Devin Morris, William R. Eisenstadt, Andrea Paganini, Mustapha Slamani, Timothy Platt, John Ferrario

Proceedings of the 2011 IEEE International Test Conference, 2010

2009

On Boosting the Accuracy of Non-RF to RF Correlation-Based Specification Test Compaction.

Nathan Kupp, Petros Drineas, Mustapha Slamani, Yiorgos Makris

J. Electron. Test., 2009

2008

Confidence Estimation in Non-RF to RF Correlation-Based Specification Test Compaction.

Nathan Kupp, Petros Drineas, Mustapha Slamani, Yiorgos Makris

Proceedings of the 13th European Test Symposium, 2008

2007

RF Testing on a Mixed Signal Tester.

Dana Brown, John Ferrario, Randy Wolf, Jing Li, Jayendra Bhagat, Mustapha Slamani

J. Electron. Test., 2007

Non-RF to RF Test Correlation Using Learning Machines: A Case Study.

Haralampos-G. D. Stratigopoulos, Petros Drineas, Mustapha Slamani, Yiorgos Makris

Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007

2006

A BICMOS 120 MW 11 GHZ transimpedance amplifier Dedicated for High-Speed Photoreceivers.

André Boyoguéno, Mohamad Sawan, Mustapha Slamani

J. Circuits Syst. Comput., 2006

2005

Reducing high-speed/RF test cost - guaranteed by design or guaranteed to fail?

Mustapha Slamani

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2004

ITC 2003 panels: Part 2.

Carol Stolicny, Mustapha Slamani, Fidel Muradali, Geir Eide, Mike Li

IEEE Des. Test Comput., 2004

2003

A low-cost test solution for wireless phone RFICs.

John Ferrario, Randy Wolf, Steve Moss, Mustapha Slamani

IEEE Commun. Mag., 2003

RF Test 101: Defining the Problem, Finding Solutions.

Mustapha Slamani

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

Wireless Test.

Robert C. Aitken, Mustapha Slamani, H. Ding, William R. Eisenstadt, Sanghoon Choi, John McLaughlin

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

Testing Highly Integrated Wireless Circuits and Systems with Low Cost Tester: How to Overcome the Challenge?

Mustapha Slamani

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

A Unity Gain High Speed Buffer to Improve Signal Integrity in High Frequency Test Interface.

Iboun Taimiya Sylla, Mustapha Slamani, Bozena Kaminska

J. Electron. Test., 2001

Reducing Test Time in the High-Volume Production of Analog Circuits using Efficient Test-Vector Generation and Interpolation Techniques.

Mustapha Slamani, Karim Arabi

J. Electron. Test., 2001

2000

A preamplifier IC design for photonic links.

André Boyoguéno, Bozena Kaminska, Mustapha Slamani

Proceedings of the IEEE International Symposium on Circuits and Systems, 2000

New CMOS integrated pulse width modulator for voltage conversion applications.

Abdelohahab Djemouai, Mohamad Sawan, Mustapha Slamani

Proceedings of the 2000 7th IEEE International Conference on Electronics, 2000

1999

An efficient RF power transfer and bidirectional data transmission to implantable electronic devices.

Abdelohahab Djemouai, Mohamad Sawan, Mustapha Slamani

Proceedings of the 1999 International Symposium on Circuits and Systems, ISCAS 1999, Orlando, Florida, USA, May 30, 1999

A 200 MHz frequency-locked loop based on new frequency-to-voltage converters approach.

Abdelohahab Djemouai, Mohamad Sawan, Mustapha Slamani

Proceedings of the 1999 International Symposium on Circuits and Systems, ISCAS 1999, Orlando, Florida, USA, May 30, 1999

New circuit techniques based on a high performance frequency-to-voltage converter.

Abdelohahab Djemouai, Mohamad Sawan, Mustapha Slamani

Proceedings of the 6th IEEE International Conference on Electronics, Circuits and Systems, 1999

1998

Impedance Mismatch and Lumped Capacitance Effects in High Frequency Testing.

Iboun Taimiya Sylla, Mustapha Slamani, Bozena Kaminska, Fartoumi M. Hossein, Patrick Vincent

Proceedings of the 16th IEEE VLSI Test Symposium (VTS '98), 28 April, 1998

A DSP testing approach by modeling the circuit response as a Markov chain.

Mustapha Slamani, Maddi Zineb, Mounir Boukadoum

Proceedings of the 5th IEEE International Conference on Electronics, Circuits and Systems, 1998

1995

Multifrequency Analysis of Faults in Analog Circuits.

Mustapha Slamani, Bozena Kaminska

IEEE Des. Test Comput., 1995

1994

Multifrequency testability analysis for analog circuits.

Mustapha Slamani, Bozena Kaminska

Proceedings of the 12th IEEE VLSI Test Symposium (VTS'94), 1994

An Integrated Approach for Analog Ciruit Testing with a Minmum Number of Detected Parameters.

Mustapha Slamani, Bozena Kaminska, Guy Quesnel

Proceedings of the Proceedings IEEE International Test Conference 1994, 1994

1992

Analog Circuit Fault Diagnosis Based on Sensitivity Computation and Functional Testing.

Mustapha Slamani, Bozena Kaminska

IEEE Des. Test Comput., 1992