Muqian Niu

According to our database1, Muqian Niu authored at least 2 papers in 2021.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

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Article 
PhD thesis 
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Links

On csauthors.net:

Bibliography

2021
Analysis and modeling for MOSFET degradation under RF stress.
IEICE Electron. Express, 2021

Impact of RF stress on the low-frequency noise in nMOSFETs.
IEICE Electron. Express, 2021


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