Muqian Niu

According to our database, Muqian Niu authored at least 2 papers in 2021.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2021

Analysis and modeling for MOSFET degradation under RF stress.

Haipeng Fu, Liping Yang, Muqian Niu, Xuguang Li, Kaixue Ma

IEICE Electron. Express, 2021

Impact of RF stress on the low-frequency noise in nMOSFETs.

Haipeng Fu, Muqian Niu, Liping Yang, Xuguang Li, Kaixue Ma

IEICE Electron. Express, 2021