Mukesh Puri

According to our database1, Mukesh Puri authored at least 3 papers in 2000.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Links

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Bibliography

2000
Testing SRAM-Based Content Addressable Memories.
IEEE Trans. Computers, 2000

Detection of Inter-Port Faults in Multi-Port Static RAMs.
Proceedings of the 18th IEEE VLSI Test Symposium (VTS 2000), 30 April, 2000

Optimizing Memory Tests by Analyzing Defect Coverage.
Proceedings of the 8th IEEE International Workshop on Memory Technology, 2000


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