Muhammad Bashir

According to our database, Muhammad Bashir authored at least 13 papers between 2009 and 2021.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2021

Optimal Supervisory Control for Flexible Manufacturing Systems Model With Petri Nets: A Place-Transition Control.

Muhammad Bashir, Jian Zhou, Bashir Bala Muhammad

IEEE Access, 2021

2020

Optimal enforcement of liveness for decentralized systems of flexible manufacturing systems using Petri nets.

Muhammad Bashir

Trans. Inst. Meas. Control, 2020

An Improved Method of Particle Swarm Optimization for Path Planning of Mobile Robot.

Xun Li, Dandan Wu, Jingjing He, Muhammad Bashir, Liping Ma

J. Control. Sci. Eng., 2020

2018

On structural reduction of liveness-enforcing Petri net supervisors for flexible manufacturing systems: an algebraic approach.

Muhammad Bashir, Zhiwu Li, Murat Uzam, Naiqi Wu, Abdulrahman Al-Ahmari

IMA J. Math. Control. Inf., 2018

2017

A Minimal Supervisory Structure to Optimally Enforce Liveness on Petri Net Models for Flexible Manufacturing Systems.

Muhammad Bashir, Zhiwu Li, Murat Uzam, Abdulrahman Al-Ahmari, Naiqi Wu, Ding Liu, Ting Qu

IEEE Access, 2017

2015

Hydrophilic Surface Modification of PDMS Microchannel for O/W and W/O/W Emulsions.

Shazia Bashir, Muhammad Bashir, Xavier Casadevall i Solvas, Julia M. Rees, William B. Zimmerman

Micromachines, 2015

2014

Backend Dielectric Reliability Full Chip Simulator.

Muhammad Muqarrab Bashir, Chang-Chih Chen, Linda Milor, Dae Hyun Kim, Sung Kyu Lim

IEEE Trans. Very Large Scale Integr. Syst., 2014

Simulation of system backend dielectric reliability.

Chang-Chih Chen, Muhammad Bashir, Linda S. Milor, Daehyun Kim, Sung Kyu Lim

Microelectron. J., 2014

2011

Impact of irregular geometries on low-k dielectric breakdown.

Muhammad Bashir, Linda Milor, Dae Hyun Kim, Sung Kyu Lim

Microelectron. Reliab., 2011

2010

Methodology to determine the impact of linewidth variation on chip scale copper/low-k backend dielectric breakdown.

Muhammad Bashir, Linda S. Milor, Dae Hyun Kim, Sung Kyu Lim

Microelectron. Reliab., 2010

Towards a chip level reliability simulator for copper/low-k backend processes.

Muhammad Bashir, Linda S. Milor

Proceedings of the Design, Automation and Test in Europe, 2010

2009

A methodology to extract failure rates for low-k dielectric breakdown with multiple geometries and in the presence of die-to-die linewidth variation.

Muhammad Bashir, Linda S. Milor

Microelectron. Reliab., 2009

Modeling Low-k Dielectric Breakdown to Determine Lifetime Requirements.

Muhammad Bashir, Linda Milor

IEEE Des. Test Comput., 2009