Mu Nie
According to our database1,
Mu Nie
authored at least 9 papers
between 2017 and 2024.
Collaborative distances:
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Bibliography
2024
Microelectron. J., 2024
2023
Int. J. Mach. Learn. Cybern., July, 2023
Eng. Appl. Artif. Intell., 2023
Enhancing Defect Diagnosis and Localization in Wafer Map Testing Through Weakly Supervised Learning.
Proceedings of the 32nd IEEE Asian Test Symposium, 2023
2022
Broadcast-TDMA: A Cost-Effective Fault-Tolerance Method for TSV Lifetime Reliability Enhancement.
IEEE Des. Test, 2022
2021
Proceedings of the 2021 IEEE/CVF International Conference on Computer Vision, 2021
2020
2017
IEICE Trans. Electron., 2017
IEICE Electron. Express, 2017