Mottaqiallah Taouil

According to our database, Mottaqiallah Taouil authored at least 156 papers between 2010 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2024

The Security Evaluation of an Efficient Lightweight AES Accelerator.

Abdullah Aljuffri, Ruoyu Huang, Laura Muntenaar, Georgi Gaydadjiev, Kezheng Ma, Said Hamdioui, Mottaqiallah Taouil

Cryptogr., June, 2024

Survey on Architectural Attacks: A Unified Classification and Attack Model.

Tara Ghasempouri, Jaan Raik, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil

ACM Comput. Surv., February, 2024

Memristor-Based Lightweight Encryption.

Muhammad Ali Siddiqi, Jan Andrés Galvan Hernández, Anteneh Gebregiorgis, Rajendra Bishnoi, Christos Strydis, Said Hamdioui, Mottaqiallah Taouil

CoRR, 2024

Multi-Level FeFET-Based CAM Address Decoder.

Thomas Makryniotis, Georgi Gaydadjiev, Said Hamdioui, Mottaqiallah Taouil

Proceedings of the 32nd IFIP/IEEE International Conference on Very Large Scale Integration, 2024

A Unified Functional Safety EDA Framework for Accurate Diagnostic Coverage Estimation.

Abhiroop Bhowmik, Subin Babukutty, Mottaqiallah Taouil, Moritz Fieback

Proceedings of the 32nd IFIP/IEEE International Conference on Very Large Scale Integration, 2024

Analyzing the Use of Temperature to Facilitate Fault Propagation in ReRAMs.

Thiago Copetti, A. Chordia, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui, Letícia Maria Veiras Bolzani

Proceedings of the 25th IEEE Latin American Test Symposium, 2024

Analysis of Conductance Variability in RRAM for Accurate Neuromorphic Computing.

Hassen Aziza, Jérémy Postel-Pellerin, Moritz Fieback, Said Hamdioui, Hanzhi Xun, Mottaqiallah Taouil, Karine Coulié, Wenceslas Rahajandraibe

Proceedings of the 25th IEEE Latin American Test Symposium, 2024

Testing STT-MRAMs: Do We Need Magnets in our Automated Test Equipment?

Sicong Yuan, Hanzhi Xun, Woojin Kim, Siddharth Rao, Erik Jan Marinissen, Sebastien Couet, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the IEEE International Test Conference, 2024

Robust Design-for-Testability Scheme for Conventional and Unique Defects in RRAMs.

Hanzhi Xun, Moritz Fieback, Mohammad Amin Yaldagard, Sicong Yuan, Erbing Hua, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the IEEE International Test Conference, 2024

Defects, Fault Modeling, and Test Development Framework for FeFETs.

Changhao Wang, Sicong Yuan, Hanzhi Xun, Chaobo Li, Mottaqiallah Taouil, Moritz Fieback, Danyang Chen, Xiuyan Li, Lin Wang, Riccardo Cantoro, Chujun Yin, Said Hamdioui

Proceedings of the IEEE International Test Conference, 2024

Design-for-Test for Intermittent Faults in STT-MRAMs.

Sicong Yuan, Mohammad Amin Yaldagard, Hanzhi Xun, Moritz Fieback, Erik Jan Marinissen, Woojin Kim, Siddharth Rao, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the IEEE European Test Symposium, 2024

Online Detection of Unique Faults in RRAMs.

Hanzhi Xun, Moritz Fieback, Mohammad Amin Yaldagard, Sicong Yuan, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the IEEE European Test Symposium, 2024

Extracting Weights of CIM-Based Neural Networks Through Power Analysis of Adder-Trees.

Fouwad Jamil Mir, Abdullah Aljuffri, Said Hamdioui, Mottaqiallah Taouil

Proceedings of the IEEE European Test Symposium, 2024

Counteracting Rowhammer by Data Alternation.

Stefan A. Lung, Georgi Gaydadjiev, Said Hamdioui, Mottaqiallah Taouil

Proceedings of the IEEE European Test Symposium, 2024

Trusted SMEs for Sustainable Growth of Europeans Economical Backbone to Strengthen the Digital Sovereignty: The KDT Resilient Trust Project.

Hassan Aboushady, Noemie Beringuier-Boher, Kelly Burke, Philippe Dallemagne, Mario De Biase, Manuel Di Frangia, Virginie Deniau, Enrico Ferrari, Christophe Gaquière, Dominique Morche, Fabio Patrone, Stefano Pesci, Luigi Pomante, Andries Stam, Vincenzo Stornelli, Haralampos-G. Stratigopoulos, Mottaqiallah Taouil, Emmanuel Vaumorin, Jonathan Villain, Sander Steeghs

Proceedings of the 27th Euromicro Conference on Digital System Design, 2024

Device-Aware Diagnosis for Yield Learning in RRAMs.

Hanzhi Xun, Moritz Fieback, Sicong Yuan, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2024

2023

A Survey on Machine Learning in Hardware Security.

Troya Çagil Köylü, Cezar Rodolfo Wedig Reinbrecht, Anteneh Gebregiorgis, Said Hamdioui, Mottaqiallah Taouil

ACM J. Emerg. Technol. Comput. Syst., April, 2023

Modeling and Analysis of SRAM PUF Bias Patterns in 14nm and 7nm FinFET Technology Nodes.

Shayesteh Masoumian, Roel Maes, Rui Wang, Karthik Keni Yerriswamy, Geert Jan Schrijen, Said Hamdioui, Mottaqiallah Taouil

Proceedings of the 31st IFIP/IEEE International Conference on Very Large Scale Integration, 2023

Securing an Efficient Lightweight AES Accelerator.

Ruoyu Huang, Abdullah Aljuffri, Said Hamdioui, Kezheng Ma, Mottaqiallah Taouil

Proceedings of the 22nd IEEE International Conference on Trust, 2023

Magnetic Coupling Based Test Development for Contact and Interconnect Defects in STT-MRAMs.

Sicong Yuan, Ziwei Zhang, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the IEEE International Test Conference, 2023

Device-Aware Test for Ion Depletion Defects in RRAMs.

Hanzhi Xun, Sicong Yuan, Moritz Fieback, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the IEEE International Test Conference, 2023

Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs.

Hanzhi Xun, Moritz Fieback, Sicong Yuan, Ziwei Zhang, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the IEEE European Test Symposium, 2023

Dependability of Future Edge-AI Processors: Pandora's Box.

Manil Dev Gomony, Anteneh Gebregiorgis, Moritz Fieback, Marc Geilen, Sander Stuijk, Jan Richter-Brockmann, Rajendra Bishnoi, Sven Argo, Lara Arche Andradas, Tim Güneysu, Mottaqiallah Taouil, Henk Corporaal, Said Hamdioui

Proceedings of the IEEE European Test Symposium, 2023

Online Fault Detection and Diagnosis in RRAM.

Moritz Fieback, Filip Bradaric, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the IEEE European Test Symposium, 2023

Memristor-Based Lightweight Encryption.

Muhammad Ali Siddiqi, Jan Andrés Galvan Hernández, Anteneh Gebreziorgis, Rajendra Bishnoi, Christos Strydis, Said Hamdioui, Mottaqiallah Taouil

Proceedings of the 26th Euromicro Conference on Digital System Design, 2023

A Pre-Silicon Power Leakage Assessment Based on Generative Adversarial Networks.

Abdullah Aljuffri, Mudit Saxena, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil

Proceedings of the 26th Euromicro Conference on Digital System Design, 2023

Device-Aware Test for Back-Hopping Defects in STT-MRAMs.

Sicong Yuan, Mottaqiallah Taouil, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Said Hamdioui

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023

Characterization and Test of Intermittent Over RESET in RRAMs.

Hanzhi Xun, Moritz Fieback, Sicong Yuan, Hassen Aziza, Mathijs Heidekamp, Thiago Copetti, Letícia Maria Veiras Bolzani Poehls, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the 32nd IEEE Asian Test Symposium, 2023

Device Aware Diagnosis for Unique Defects in STT-MRAMs.

Ahmed Aouichi, Sicong Yuan, Moritz Fieback, Siddharth Rao, Woojin Kim, Erik Jan Marinissen, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the 32nd IEEE Asian Test Symposium, 2023

2022

Instruction flow-based detectors against fault injection attacks.

Troya Çagil Köylü, Cezar Rodolfo Wedig Reinbrecht, Marcelo Brandalero, Said Hamdioui, Mottaqiallah Taouil

Microprocess. Microsystems, October, 2022

APmap: An Open-Source Compiler for Automata Processors.

Jintao Yu, Muath Abu Lebdeh, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Said Hamdioui

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

MFA-MTJ Model: Magnetic-Field-Aware Compact Model of pMTJ for Robust STT-MRAM Design.

Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

Characterization, Modeling, and Test of Intermediate State Defects in STT-MRAMs.

Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui

IEEE Trans. Computers, 2022

A Survey on Memory-centric Computer Architectures.

Anteneh Gebregiorgis, Hoang Anh Du Nguyen, Jintao Yu, Rajendra Bishnoi, Mottaqiallah Taouil, Francky Catthoor, Said Hamdioui

ACM J. Emerg. Technol. Comput. Syst., 2022

Defects, Fault Modeling, and Test Development Framework for RRAMs.

Moritz Fieback, Guilherme Cardoso Medeiros, Lizhou Wu, Hassen Aziza, Rajendra Bishnoi, Mottaqiallah Taouil, Said Hamdioui

ACM J. Emerg. Technol. Comput. Syst., 2022

Rapid Design-Space Exploration for Low-Power Manycores Under Process Variation Utilizing Machine Learning.

Sohaib Majzoub, Resve A. Saleh, Mottaqiallah Taouil, Said Hamdioui, Mohamed Bamakhrama

IEEE Access, 2022

On BTI Aging Rejuvenation in Memory Address Decoders.

Cemil Cem Gürsoy, Daniel Kraak, Foisal Ahmed, Mottaqiallah Taouil, Maksim Jenihhin, Said Hamdioui

Proceedings of the 23rd IEEE Latin American Test Symposium, 2022

Structured Test Development Approach for Computation-in-Memory Architectures.

Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the IEEE International Test Conference in Asia, 2022

Hierarchical Memory Diagnosis.

Guilherme Cardoso Medeiros, Moritz Fieback, Anteneh Gebregiorgis, Mottaqiallah Taouil, Letícia Maria Veiras Bolzani, Said Hamdioui

Proceedings of the IEEE European Test Symposium, 2022

Smart Redundancy Schemes for ANNs Against Fault Attacks.

Troya Çagil Köylü, Said Hamdioui, Mottaqiallah Taouil

Proceedings of the IEEE European Test Symposium, 2022

PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory.

Moritz Fieback, Christopher Münch, Anteneh Gebregiorgis, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Mehdi B. Tahoori

Proceedings of the IEEE European Test Symposium, 2022

Exploiting PUF Variation to Detect Fault Injection Attacks.

Troya Çagil Köylü, Luíza C. Garaffa, Cezar Reinbrecht, Mahdi Zahedi, Said Hamdioui, Mottaqiallah Taouil

Proceedings of the 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2022

Reliability Analysis of FinFET-Based SRAM PUFs for 16nm, 14nm, and 7nm Technology Nodes.

Shayesteh Masoumian, Georgios N. Selimis, Rui Wang, Geert Jan Schrijen, Said Hamdioui, Mottaqiallah Taouil

Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition, 2022

Using Hopfield Networks to Correct Instruction Faults.

Troya Çagil Köylü, Moritz Fieback, Said Hamdioui, Mottaqiallah Taouil

Proceedings of the IEEE 31st Asian Test Symposium, 2022

2021

Hard-to-Detect Fault Analysis in FinFET SRAMs.

Guilherme Cardoso Medeiros, Moritz Fieback, Lizhou Wu, Mottaqiallah Taouil, Letícia Maria Bolzani Poehls, Said Hamdioui

IEEE Trans. Very Large Scale Integr. Syst., 2021

Applying Thermal Side-Channel Attacks on Asymmetric Cryptography.

Abdullah Aljuffri, Marc Zwalua, Cezar Rodolfo Wedig Reinbrecht, Said Hamdioui, Mottaqiallah Taouil

IEEE Trans. Very Large Scale Integr. Syst., 2021

Defect and Fault Modeling Framework for STT-MRAM Testing.

Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Guilherme Cardoso Medeiros, Moritz Fieback, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui

IEEE Trans. Emerg. Top. Comput., 2021

Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects.

Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Letícia Maria Bolzani Poehls, Tiago Roberto Balen

J. Electron. Test., 2021

Multi-Bit Blinding: A Countermeasure for RSA Against Side Channel Attacks.

Abdullah Aljuffri, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil

Proceedings of the 39th IEEE VLSI Test Symposium, 2021

Deterministic and Statistical Strategies to Protect ANNs against Fault Injection Attacks.

Troya Çagil Köylü, Cezar Rodolfo Wedig Reinbrecht, Said Hamdioui, Mottaqiallah Taouil

Proceedings of the 18th International Conference on Privacy, Security and Trust, 2021

Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions.

Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui

Proceedings of the IEEE International Test Conference, 2021

LightRoAD: Lightweight Rowhammer Attack Detector.

Mottaqiallah Taouil, Cezar Reinbrecht, Said Hamdioui, Johanna Sepúlveda

Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2021

Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs.

G. Cardoso Medeiros, Moritz Fieback, Anteneh Gebregiorgis, Mottaqiallah Taouil, Leticia Bolzani Poehls, Said Hamdioui

Proceedings of the 26th IEEE European Test Symposium, 2021

Intermittent Undefined State Fault in RRAMs.

Moritz Fieback, Guilherme Cardoso Medeiros, Anteneh Gebregiorgis, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the 26th IEEE European Test Symposium, 2021

Power Side Channel Attacks: Where Are We Standing?

Mottaqiallah Taouil, Abdullah Aljuffri, Said Hamdioui

Proceedings of the 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2021

Improving the Detection of Undefined State Faults in FinFET SRAMs.

G. Cardoso Medeiros, Moritz Fieback, Thiago Santos Copetti, Anteneh Gebregiorgis, Mottaqiallah Taouil, Leticia B. Poehls, Said Hamdioui

Proceedings of the 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2021

Impact of Data Pre-Processing Techniques on Deep Learning Based Power Attacks.

Abdullah Aljuffri, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil

Proceedings of the 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2021

Protecting IoT Devices through a Hardware-driven Memory Verification.

Troya Çagil Köylü, Hans Okkerman, Cezar Rodolfo Wedig Reinbrecht, Said Hamdioui, Mottaqiallah Taouil

Proceedings of the 24th Euromicro Conference on Digital System Design, 2021

Revealing the Secrets of Spiking Neural Networks: The Case of Izhikevich Neuron.

Luíza C. Garaffa, Abdullah Aljuffri, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil, Johanna Sepúlveda

Proceedings of the 24th Euromicro Conference on Digital System Design, 2021

Characterization and Fault Modeling of Intermediate State Defects in STT-MRAM.

Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2021

GRINCH: A Cache Attack against GIFT Lightweight Cipher.

Cezar Reinbrecht, Abdullah Aljuffri, Said Hamdioui, Mottaqiallah Taouil, Johanna Sepúlveda

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2021

Density Enhancement of RRAMs using a RESET Write Termination for MLC Operation.

Hassen Aziza, Said Hamdioui, Moritz Fieback, Mottaqiallah Taouil, Mathieu Moreau

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2021

2020

Skeleton-Based Synthesis Flow for Computation-in-Memory Architectures.

Jintao Yu, Razvan Nane, Imran Ashraf, Mottaqiallah Taouil, Said Hamdioui, Henk Corporaal, Koen Bertels

IEEE Trans. Emerg. Top. Comput., 2020

A Classification of Memory-Centric Computing.

Hoang Anh Du Nguyen, Jintao Yu, Muath Abu Lebdeh, Mottaqiallah Taouil, Said Hamdioui, Francky Catthoor

ACM J. Emerg. Technol. Comput. Syst., 2020

Public-Key Based Authentication Architecture for IoT Devices Using PUF.

Haji Akhundov, Erik van der Sluis, Said Hamdioui, Mottaqiallah Taouil

CoRR, 2020

Survey on STT-MRAM Testing: Failure Mechanisms, Fault Models, and Tests.

Lizhou Wu, Mottaqiallah Taouil, Siddharth Rao, Erik Jan Marinissen, Said Hamdioui

CoRR, 2020

An Energy-Efficient Current-Controlled Write and Read Scheme for Resistive RAMs (RRAMs).

Hassen Aziza, Mathieu Moreau, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui

IEEE Access, 2020

S-NET: A Confusion Based Countermeasure Against Power Attacks for SBOX.

Abdullah Aljuffri, Pradeep Venkatachalam, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil

Proceedings of the Embedded Computer Systems: Architectures, Modeling, and Simulation, 2020

Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects.

Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Leticia Bolzani Poehls, Tiago R. Balen

Proceedings of the IEEE Latin-American Test Symposium, 2020

Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs.

Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui

Proceedings of the IEEE International Test Conference, 2020

Guard-NoC: A Protection Against Side-Channel Attacks for MPSoCs.

Cezar Reinbrecht, Abdullah Aljuffri, Said Hamdioui, Mottaqiallah Taouil, Bruno Forlin, Johanna Sepúlveda

Proceedings of the 2020 IEEE Computer Society Annual Symposium on VLSI, 2020

RNN-Based Detection of Fault Attacks on RSA.

Troya Çagil Köylü, Cezar Rodolfo Wedig Reinbrecht, Said Hamdioui, Mottaqiallah Taouil

Proceedings of the IEEE International Symposium on Circuits and Systems, 2020

Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level.

Lizhou Wu, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the IEEE European Test Symposium, 2020

LiD-CAT: A Lightweight Detector for Cache ATtacks.

Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil, Behrad Niazmand, Tara Ghasempouri, Jaan Raik, Johanna Sepúlveda

Proceedings of the IEEE European Test Symposium, 2020

Modeling Static Noise Margin for FinFET based SRAM PUFs.

Shayesteh Masoumian, Georgios N. Selimis, Roel Maes, Geert Jan Schrijen, Said Hamdioui, Mottaqiallah Taouil

Proceedings of the IEEE European Test Symposium, 2020

G-PUF: An Intrinsic PUF Based on GPU Error Signatures.

Bruno Forlin, Ronaldo Husemann, Luigi Carro, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil

Proceedings of the IEEE European Test Symposium, 2020

Testing Scouting Logic-Based Computation-in-Memory Architectures.

Moritz Fieback, Surya Nagarajan, Rajendra Bishnoi, Mehdi B. Tahoori, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the IEEE European Test Symposium, 2020

eSRAM Reliability: Why is it still not optimally solved?

Daniël Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor

Proceedings of the 15th Design & Technology of Integrated Systems in Nanoscale Era, 2020

A Security Verification Template to Assess Cache Architecture Vulnerabilities.

Tara Ghasempouri, Jaan Raik, Kolin Paul, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil

Proceedings of the 23rd International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2020

Impact of Magnetic Coupling and Density on STT-MRAM Performance.

Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui

Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020

A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs.

Guilherme Cardoso Medeiros, Cemil Cem Gürsoy, Lizhou Wu, Moritz Fieback, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020

Mitigation of Sense Amplifier Degradation Using Skewed Design.

Daniel Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor

Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020

RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems.

Maksim Jenihhin, Said Hamdioui, Matteo Sonza Reorda, Milos Krstic, Peter Langendörfer, Christian Sauer, Anton Klotz, Michael Hübner, Jörg Nolte, Heinrich Theodor Vierhaus, Georgios N. Selimis, Dan Alexandrescu, Mottaqiallah Taouil, Geert Jan Schrijen, Jaan Raik, Luca Sterpone, Giovanni Squillero, Zoya Dyka

Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020

The Power of Computation-in-Memory Based on Memristive Devices.

Jintao Yu, Muath Abu Lebdeh, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the 25th Asia and South Pacific Design Automation Conference, 2020

2019

Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM.

Daniel Kraak, Mottaqiallah Taouil, Innocent Agbo, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor

IEEE Trans. Very Large Scale Integr. Syst., 2019

Challenges and Solutions in Emerging Memory Testing.

Elena-Ioana Vatajelu, Paolo Prinetto, Mottaqiallah Taouil, Said Hamdioui

IEEE Trans. Emerg. Top. Comput., 2019

System-Level Sub-20 nm Planar and FinFET CMOS Delay Modelling for Supply and Threshold Voltage Scaling Under Process Variation.

Sohaib Majzoub, Mottaqiallah Taouil, Said Hamdioui

J. Low Power Electron., 2019

Energy Optimization for Large-Scale 3D Manycores in the Dark-Silicon Era.

Sohaib Majzoub, Resve A. Saleh, Imran Ashraf, Mottaqiallah Taouil, Said Hamdioui

IEEE Access, 2019

Enhanced Scouting Logic: A Robust Memristive Logic Design Scheme.

Jintao Yu, Hoang Anh Du Nguyen, Muath Abu Lebdeh, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the IEEE/ACM International Symposium on Nanoscale Architectures, 2019

A computation-in-memory accelerator based on resistive devices.

Hoang Anh Du Nguyen, Jintao Yu, Muath Abu Lebdeh, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the International Symposium on Memory Systems, 2019

Software-Based Mitigation for Memory Address Decoder Aging.

Daniel H. P. Kraak, Cemil Cem Gürsoy, Innocent O. Agbo, Mottaqiallah Taouil, Maksim Jenihhin, Jaan Raik, Said Hamdioui

Proceedings of the IEEE Latin American Test Symposium, 2019

Testing Computation-in-Memory Architectures Based on Emerging Memories.

Said Hamdioui, Moritz Fieback, Surya Nagarajan, Mottaqiallah Taouil

Proceedings of the IEEE International Test Conference, 2019

Device-Aware Test: A New Test Approach Towards DPPB Level.

Moritz Fieback, Lizhou Wu, Guilherme Cardoso Medeiros, Hassen Aziza, Siddharth Rao, Erik Jan Marinissen, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the IEEE International Test Conference, 2019

Reliability Modeling and Mitigation for Embedded Memories.

Innocent Okwudili Agbo, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the IEEE International Test Conference, 2019

Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing.

Lizhou Wu, Siddharth Rao, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Erik Jan Marinissen, Farrukh Yasin, Sebastien Couet, Said Hamdioui, Gouri Sankar Kar

Proceedings of the 24th IEEE European Test Symposium, 2019

DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs.

Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Moritz Fieback, Leticia Bolzani Poehls, Said Hamdioui

Proceedings of the 24th IEEE European Test Symposium, 2019

Hardware-Based Aging Mitigation Scheme for Memory Address Decoder.

Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor

Proceedings of the 24th IEEE European Test Symposium, 2019

Time-division Multiplexing Automata Processor.

Jintao Yu, Hoang Anh Du Nguyen, Muath Abu Lebdeh, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2019

Methodology for Application-Dependent Degradation Analysis of Memory Timing.

Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2019

Applications of Computation-In-Memory Architectures based on Memristive Devices.

Said Hamdioui, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Abu Sebastian, Manuel Le Gallo, Sandeep Pande, Siebren Schaafsma, Francky Catthoor, Shidhartha Das, Fernando García-Redondo, Geethan Karunaratne, Abbas Rahimi, Luca Benini

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2019

2018

A Mapping Methodology of Boolean Logic Circuits on Memristor Crossbar.

Lei Xie, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Said Hamdioui, Koen Bertels

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018

Memory and Communication Profiling for Accelerator-Based Platforms.

Imran Ashraf, Nader Khammassi, Mottaqiallah Taouil, Koen Bertels

IEEE Trans. Computers, 2018

A defect-oriented test approach using on-Chip current sensors for resistive defects in FinFET SRAMs.

G. Cardoso Medeiros, Letícia Maria Veiras Bolzani, Mottaqiallah Taouil, Fabian Vargas, Said Hamdioui

Microelectron. Reliab., 2018

Impact and mitigation of SRAM read path aging.

Innocent Agbo, Mottaqiallah Taouil, Daniel Kraak, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene

Microelectron. Reliab., 2018

Ionizing radiation modeling in DRAM transistors.

Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui, Marco Rovatti

Proceedings of the 19th IEEE Latin-American Test Symposium, 2018

Electrical Modeling of STT-MRAM Defects.

Lizhou Wu, Mottaqiallah Taouil, Siddharth Rao, Erik Jan Marinissen, Said Hamdioui

Proceedings of the IEEE International Test Conference, 2018

Testing Resistive Memories: Where are We and What is Missing?

Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the IEEE International Test Conference, 2018

Device aging: A reliability and security concern.

Daniel Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Francky Catthoor, Abhijit Chatterjee, Adit D. Singh, Hans-Joachim Wunderlich, Naghmeh Karimi

Proceedings of the 23rd IEEE European Test Symposium, 2018

Memristive devices for computation-in-memory.

Jintao Yu, Hoang Anh Du Nguyen, Lei Xie, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the 2018 Design, Automation & Test in Europe Conference & Exhibition, 2018

Degradation analysis of high performance 14nm FinFET SRAM.

Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor

Proceedings of the 2018 Design, Automation & Test in Europe Conference & Exhibition, 2018

2017

On the Implementation of Computation-in-Memory Parallel Adder.

Hoang Anh Du Nguyen, Lei Xie, Mottaqiallah Taouil, Razvan Nane, Said Hamdioui, Koen Bertels

IEEE Trans. Very Large Scale Integr. Syst., 2017

Impact and Mitigation of Sense Amplifier Aging Degradation Using Realistic Workloads.

Daniel Kraak, Mottaqiallah Taouil, Innocent Agbo, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor

IEEE Trans. Very Large Scale Integr. Syst., 2017

Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier.

Innocent Agbo, Mottaqiallah Taouil, Daniel Kraak, Said Hamdioui, Halil Kukner, Pieter Weckx, Praveen Raghavan, Francky Catthoor

IEEE Trans. Very Large Scale Integr. Syst., 2017

Memristive devices for computing: Beyond CMOS and beyond von Neumann.

Hoang Anh Du Nguyen, Jintao Yu, Lei Xie, Mottaqiallah Taouil, Said Hamdioui, Dietmar Fey

Proceedings of the 2017 IFIP/IEEE International Conference on Very Large Scale Integration, 2017

Scouting Logic: A Novel Memristor-Based Logic Design for Resistive Computing.

Lei Xie, Hoang Anh Du Nguyen, Jintao Yu, Ali Kaichouhi, Mottaqiallah Taouil, Mohammad AlFailakawi, Said Hamdioui

Proceedings of the 2017 IEEE Computer Society Annual Symposium on VLSI, 2017

Interconnect networks for resistive computing architectures.

Hoang Anh Du Nguyen, Lei Xie, Jintao Yu, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the 12th International Conference on Design & Technology of Integrated Systems In Nanoscale Era, 2017

On the robustness of memristor based logic gates.

Lei Xie, Hoang Anh Du Nguyen, Jintao Yu, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the 20th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2017

Mitigation of sense amplifier degradation using input switching.

Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2017

2016

Synthesizing HDL to memristor technology: A generic framework.

Hoang Anh Du Nguyen, Lei Xie, Mottaqiallah Taouil, Said Hamdioui, Koen Bertels

Proceedings of the IEEE/ACM International Symposium on Nanoscale Architectures, 2016

Quantification of Sense Amplifier Offset Voltage Degradation due to Zero-and Run-Time Variability.

Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Praveen Raghavan, Francky Catthoor, Wim Dehaene

Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2016

Parallel matrix multiplication on memristor-based computation-in-memory architecture.

Adib Haron, Jintao Yu, Razvan Nane, Mottaqiallah Taouil, Said Hamdioui, Koen Bertels

Proceedings of the International Conference on High Performance Computing & Simulation, 2016

Non-volatile look-up table based FPGA implementations.

Lei Xie, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Said Hamdioui, Koen Bertels, Mohammad AlFailakawi

Proceedings of the 11th International Design & Test Symposium, 2016

Read path degradation analysis in SRAM.

Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene

Proceedings of the 21th IEEE European Test Symposium, 2016

Boolean logic gate exploration for memristor crossbar.

Lei Xie, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Said Hamdioui, Koen Bertels

Proceedings of the 2016 International Conference on Design and Technology of Integrated Systems in Nanoscale Era, 2016

Comparative BTI analysis for various sense amplifier designs.

Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Praveen Raghavan, Francky Catthoor

Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2016

2015

Yield Improvement for 3D Wafer-to-Wafer Stacked ICs Using Wafer Matching.

Mottaqiallah Taouil, Said Hamdioui, Erik Jan Marinissen

ACM Trans. Design Autom. Electr. Syst., 2015

Post-Bond Interconnect Test and Diagnosis for 3-D Memory Stacked on Logic.

Mottaqiallah Taouil, Mahmoud Masadeh, Said Hamdioui, Erik Jan Marinissen

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015

Testing Open Defects in Memristor-Based Memories.

Said Hamdioui, Mottaqiallah Taouil, Nor Zaidi Haron

IEEE Trans. Computers, 2015

Integral impact of BTI and voltage temperature variation on SRAM sense amplifier.

Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Halil Kukner, Pieter Weckx, Praveen Raghavan, Francky Catthoor

Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

Interconnect networks for memristor crossbar.

Lei Xie, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Said Hamdioui, Koen Bertels

Proceedings of the 2015 IEEE/ACM International Symposium on Nanoscale Architectures, 2015

Computation-in-memory based parallel adder.

Hoang Anh Du Nguyen, Lei Xie, Mottaqiallah Taouil, Razvan Nane, Said Hamdioui, Koen Bertels

Proceedings of the 2015 IEEE/ACM International Symposium on Nanoscale Architectures, 2015

Memory profiling for intra-application data-communication quantification: A survey.

Imran Ashraf, Mottaqiallah Taouil, Koen Bertels

Proceedings of the 10th International Design & Test Symposium, 2015

BTI analysis of SRAM write driver.

Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor

Proceedings of the 10th International Design & Test Symposium, 2015

Fast boolean logic mapped on memristor crossbar.

Lei Xie, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Koen Bertels, Said Hamdioui

Proceedings of the 33rd IEEE International Conference on Computer Design, 2015

On resistive open defect detection in DRAMs: The charge accumulation effect.

Yiorgos Sfikas, Yiorgos Tsiatouhas, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the 20th IEEE European Test Symposium, 2015

Comparative analysis of RD and Atomistic trap-based BTI models on SRAM Sense Amplifier.

Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Stefan Cosemans, Pieter Weckx, Praveen Raghavan, Francky Catthoor

Proceedings of the 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2015

Memristor based computation-in-memory architecture for data-intensive applications.

Said Hamdioui, Lei Xie, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Koen Bertels, Henk Corporaal, Hailong Jiao, Francky Catthoor, Dirk J. Wouters, Eike Linn, Jan van Lunteren

Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, 2015

2014

Yield and Cost Analysis or 3D Stacked ICs.

Mottaqiallah Taouil

PhD thesis, 2014

Quality versus cost analysis for 3D Stacked ICs.

Mottaqiallah Taouil, Said Hamdioui, Erik Jan Marinissen

Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

Direct probing on large-array fine-pitch micro-bumps of a wide-I/O logic-memory interface.

Erik Jan Marinissen, Bart De Wachter, Ken Smith, Jorg Kiesewetter, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the 2014 International Test Conference, 2014

Interconnect test for 3D stacked memory-on-logic.

Mottaqiallah Taouil, Mahmoud Masadeh, Said Hamdioui, Erik Jan Marinissen

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

2013

Exploring test opportunities for memory and interconnects in 3D ICs.

Mottaqiallah Taouil, Mihai Lefter, Said Hamdioui

Proceedings of the 8th International Design and Test Symposium, 2013

Impact of partial resistive defects and Bias Temperature Instability on SRAM decoder reliablity.

Seyab Khan, Mottaqiallah Taouil, Said Hamdioui, Halil Kukner, Praveen Raghavan, Francky Catthoor

Proceedings of the 8th International Design and Test Symposium, 2013

Impact of mid-bond testing in 3D stacked ICs.

Mottaqiallah Taouil, Said Hamdioui, Erik Jan Marinissen, Sudipta Bhawmik

Proceedings of the 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2013

Is TSV-based 3D integration suitable for inter-die memory repair?

Mihai Lefter, George Razvan Voicu, Mottaqiallah Taouil, Marius Enachescu, Said Hamdioui, Sorin Dan Cotofana

Proceedings of the Design, Automation and Test in Europe, 2013

Using 3D-COSTAR for 2.5D test cost optimization.

Mottaqiallah Taouil, Said Hamdioui, Erik Jan Marinissen, Sudipta Bhawmik

Proceedings of the 2013 IEEE International 3D Systems Integration Conference (3DIC), 2013

2012

Test Impact on the Overall Die-to-Wafer 3D Stacked IC Cost.

Mottaqiallah Taouil, Said Hamdioui, Kees Beenakker, Erik Jan Marinissen

J. Electron. Test., 2012

Yield Improvement for 3D Wafer-to-Wafer Stacked Memories.

Mottaqiallah Taouil, Said Hamdioui

J. Electron. Test., 2012

On optimizing test cost for Wafer-to-Wafer 3D-stacked ICs.

Mottaqiallah Taouil, Said Hamdioui

Proceedings of the 7th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2012

2011

On modeling and optimizing cost in 3D Stacked-ICs.

Mottaqiallah Taouil, Said Hamdioui, Erik Jan Marinissen

Proceedings of the 6th IEEE International Design and Test Workshop, 2011

Layer Redundancy Based Yield Improvement for 3D Wafer-to-Wafer Stacked Memories.

Mottaqiallah Taouil, Said Hamdioui

Proceedings of the 16th European Test Symposium, 2011

Stacking order impact on overall 3D die-to-wafer Stacked-IC cost.

Mottaqiallah Taouil, Said Hamdioui

Proceedings of the 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2011

Yield Improvement and Test Cost Optimization for 3D Stacked ICs.

Said Hamdioui, Mottaqiallah Taouil

Proceedings of the 20th IEEE Asian Test Symposium, 2011

2010

On maximizing the compound yield for 3D Wafer-to-Wafer stacked ICs.

Mottaqiallah Taouil, Said Hamdioui, Jouke Verbree, Erik Jan Marinissen

Proceedings of the 2011 IEEE International Test Conference, 2010

Performance and bandwidth optimization for biological sequence alignment.

Laiq Hasan, Zaid Al-Ars, Mottaqiallah Taouil, Koen Bertels

Proceedings of the 5th International Design and Test Workshop, 2010

Test Cost Analysis for 3D Die-to-Wafer Stacking.

Mottaqiallah Taouil, Said Hamdioui, Kees Beenakker, Erik Jan Marinissen

Proceedings of the 19th IEEE Asian Test Symposium, 2010