Moshe Eizenberg

According to our database, Moshe Eizenberg authored at least 3 papers between 2015 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2018

Impact of forming gas annealing on the degradation dynamics of Ge-based MOS stacks.

Fernando L. Aguirre, Sebastián Matías Pazos, Felix Palumbo, Sivan Fadida, Roy Winter, Moshe Eizenberg

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2016

Influence of gate oxides with high thermal conductivity on the failure distribution of InGaAs-based MOS stacks.

Felix Palumbo, Salvatore Lombardo, Moshe Eizenberg

Microelectron. Reliab., 2016

2015

General features of progressive breakdown in gate oxides: A compact model.

Felix Palumbo, Moshe Eizenberg, Salvatore Lombardo

Proceedings of the IEEE International Reliability Physics Symposium, 2015