Moritz Fieback

According to our database, Moritz Fieback authored at least 46 papers between 2018 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2024

A DfT Strategy for Guaranteeing ReRAM's Quality after Manufacturing.

Thiago Santos Copetti, Moritz Fieback, Tobias Gemmeke, Said Hamdioui, Letícia Maria Veiras Bolzani Poehls

J. Electron. Test., April, 2024

A Unified Functional Safety EDA Framework for Accurate Diagnostic Coverage Estimation.

Abhiroop Bhowmik, Subin Babukutty, Mottaqiallah Taouil, Moritz Fieback

Proceedings of the 32nd IFIP/IEEE International Conference on Very Large Scale Integration, 2024

Analyzing the Use of Temperature to Facilitate Fault Propagation in ReRAMs.

Thiago Copetti, A. Chordia, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui, Letícia Maria Veiras Bolzani

Proceedings of the 25th IEEE Latin American Test Symposium, 2024

Analysis of Conductance Variability in RRAM for Accurate Neuromorphic Computing.

Hassen Aziza, Jérémy Postel-Pellerin, Moritz Fieback, Said Hamdioui, Hanzhi Xun, Mottaqiallah Taouil, Karine Coulié, Wenceslas Rahajandraibe

Proceedings of the 25th IEEE Latin American Test Symposium, 2024

Testing STT-MRAMs: Do We Need Magnets in our Automated Test Equipment?

Sicong Yuan, Hanzhi Xun, Woojin Kim, Siddharth Rao, Erik Jan Marinissen, Sebastien Couet, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the IEEE International Test Conference, 2024

Robust Design-for-Testability Scheme for Conventional and Unique Defects in RRAMs.

Hanzhi Xun, Moritz Fieback, Mohammad Amin Yaldagard, Sicong Yuan, Erbing Hua, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the IEEE International Test Conference, 2024

Defects, Fault Modeling, and Test Development Framework for FeFETs.

Changhao Wang, Sicong Yuan, Hanzhi Xun, Chaobo Li, Mottaqiallah Taouil, Moritz Fieback, Danyang Chen, Xiuyan Li, Lin Wang, Riccardo Cantoro, Chujun Yin, Said Hamdioui

Proceedings of the IEEE International Test Conference, 2024

Design-for-Test for Intermittent Faults in STT-MRAMs.

Sicong Yuan, Mohammad Amin Yaldagard, Hanzhi Xun, Moritz Fieback, Erik Jan Marinissen, Woojin Kim, Siddharth Rao, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the IEEE European Test Symposium, 2024

Online Detection of Unique Faults in RRAMs.

Hanzhi Xun, Moritz Fieback, Mohammad Amin Yaldagard, Sicong Yuan, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the IEEE European Test Symposium, 2024

Lifecycle Management of Emerging Memories.

Moritz Fieback, Letícia Maria Veiras Bolzani Poehls

Proceedings of the IEEE European Test Symposium, 2024

Device-Aware Diagnosis for Yield Learning in RRAMs.

Hanzhi Xun, Moritz Fieback, Sicong Yuan, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2024

2023

Magnetic Coupling Based Test Development for Contact and Interconnect Defects in STT-MRAMs.

Sicong Yuan, Ziwei Zhang, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the IEEE International Test Conference, 2023

Device-Aware Test for Ion Depletion Defects in RRAMs.

Hanzhi Xun, Sicong Yuan, Moritz Fieback, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the IEEE International Test Conference, 2023

Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs.

Hanzhi Xun, Moritz Fieback, Sicong Yuan, Ziwei Zhang, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the IEEE European Test Symposium, 2023

Dependability of Future Edge-AI Processors: Pandora's Box.

Manil Dev Gomony, Anteneh Gebregiorgis, Moritz Fieback, Marc Geilen, Sander Stuijk, Jan Richter-Brockmann, Rajendra Bishnoi, Sven Argo, Lara Arche Andradas, Tim Güneysu, Mottaqiallah Taouil, Henk Corporaal, Said Hamdioui

Proceedings of the IEEE European Test Symposium, 2023

Online Fault Detection and Diagnosis in RRAM.

Moritz Fieback, Filip Bradaric, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the IEEE European Test Symposium, 2023

Device-Aware Test for Back-Hopping Defects in STT-MRAMs.

Sicong Yuan, Mottaqiallah Taouil, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Said Hamdioui

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023

Characterization and Test of Intermittent Over RESET in RRAMs.

Hanzhi Xun, Moritz Fieback, Sicong Yuan, Hassen Aziza, Mathijs Heidekamp, Thiago Copetti, Letícia Maria Veiras Bolzani Poehls, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the 32nd IEEE Asian Test Symposium, 2023

Device Aware Diagnosis for Unique Defects in STT-MRAMs.

Ahmed Aouichi, Sicong Yuan, Moritz Fieback, Siddharth Rao, Woojin Kim, Erik Jan Marinissen, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the 32nd IEEE Asian Test Symposium, 2023

2022

Defects, Fault Modeling, and Test Development Framework for RRAMs.

Moritz Fieback, Guilherme Cardoso Medeiros, Lizhou Wu, Hassen Aziza, Rajendra Bishnoi, Mottaqiallah Taouil, Said Hamdioui

ACM J. Emerg. Technol. Comput. Syst., 2022

Exploring an On-Chip Sensor to Detect Unique Faults in RRAMs.

Thiago Santos Copetti, M. Nilovic, Moritz Fieback, Tobias Gemmeke, Said Hamdioui, Letícia Maria Bolzani Poehls

Proceedings of the 23rd IEEE Latin American Test Symposium, 2022

Accelerating RRAM Testing with a Low-cost Computation-in-Memory based DFT.

Abhairaj Singh, Moritz Fieback, Rajendra Bishnoi, Filip Bradaric, Anteneh Gebregiorgis, Rajiv V. Joshi, Said Hamdioui

Proceedings of the IEEE International Test Conference, 2022

Structured Test Development Approach for Computation-in-Memory Architectures.

Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the IEEE International Test Conference in Asia, 2022

Recent Trends and Perspectives on Defect-Oriented Testing.

Paolo Bernardi, Riccardo Cantoro, Anthony Coyette, W. Dobbeleare, Moritz Fieback, Andrea Floridia, G. Gielenk, Jhon Gomez, Michelangelo Grosso, Andrea Guerriero, Iacopo Guglielminetti, Said Hamdioui, Giorgio Insinga, N. Mautone, Nunzio Mirabella, Sandro Sartoni, Matteo Sonza Reorda, Rudolf Ullmann, Ronny Vanhooren, N. Xamak, Lizhou Wu

Proceedings of the 28th IEEE International Symposium on On-Line Testing and Robust System Design, 2022

Hierarchical Memory Diagnosis.

Guilherme Cardoso Medeiros, Moritz Fieback, Anteneh Gebregiorgis, Mottaqiallah Taouil, Letícia Maria Veiras Bolzani, Said Hamdioui

Proceedings of the IEEE European Test Symposium, 2022

PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory.

Moritz Fieback, Christopher Münch, Anteneh Gebregiorgis, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Mehdi B. Tahoori

Proceedings of the IEEE European Test Symposium, 2022

Using Hopfield Networks to Correct Instruction Faults.

Troya Çagil Köylü, Moritz Fieback, Said Hamdioui, Mottaqiallah Taouil

Proceedings of the IEEE 31st Asian Test Symposium, 2022

2021

Hard-to-Detect Fault Analysis in FinFET SRAMs.

Guilherme Cardoso Medeiros, Moritz Fieback, Lizhou Wu, Mottaqiallah Taouil, Letícia Maria Bolzani Poehls, Said Hamdioui

IEEE Trans. Very Large Scale Integr. Syst., 2021

Defect and Fault Modeling Framework for STT-MRAM Testing.

Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Guilherme Cardoso Medeiros, Moritz Fieback, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui

IEEE Trans. Emerg. Top. Comput., 2021

Review of Manufacturing Process Defects and Their Effects on Memristive Devices.

Letícia Maria Veiras Bolzani, Moritz Fieback, Susanne Hoffmann-Eifert, Thiago Copetti, E. Brum, Stephan Menzel, Said Hamdioui, Tobias Gemmeke

J. Electron. Test., 2021

Evaluating the Impact of Process Variation on RRAMs.

E. Brum, Moritz Fieback, Thiago Santos Copetti, H. Jiayi, Said Hamdioui, Fabian Vargas, Letícia Maria Veiras Bolzani

Proceedings of the 22nd IEEE Latin American Test Symposium, 2021

Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs.

G. Cardoso Medeiros, Moritz Fieback, Anteneh Gebregiorgis, Mottaqiallah Taouil, Leticia Bolzani Poehls, Said Hamdioui

Proceedings of the 26th IEEE European Test Symposium, 2021

Intermittent Undefined State Fault in RRAMs.

Moritz Fieback, Guilherme Cardoso Medeiros, Anteneh Gebregiorgis, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the 26th IEEE European Test Symposium, 2021

Improving the Detection of Undefined State Faults in FinFET SRAMs.

G. Cardoso Medeiros, Moritz Fieback, Thiago Santos Copetti, Anteneh Gebregiorgis, Mottaqiallah Taouil, Leticia B. Poehls, Said Hamdioui

Proceedings of the 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2021

Density Enhancement of RRAMs using a RESET Write Termination for MLC Operation.

Hassen Aziza, Said Hamdioui, Moritz Fieback, Mottaqiallah Taouil, Mathieu Moreau

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2021

2020

An Energy-Efficient Current-Controlled Write and Read Scheme for Resistive RAMs (RRAMs).

Hassen Aziza, Mathieu Moreau, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui

IEEE Access, 2020

Special Session - Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis.

Rajendra Bishnoi, Lizhou Wu, Moritz Fieback, Christopher Münch, Sarath Mohanachandran Nair, Mehdi Baradaran Tahoori, Ying Wang, Huawei Li, Said Hamdioui

Proceedings of the 38th IEEE VLSI Test Symposium, 2020

Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level.

Lizhou Wu, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the IEEE European Test Symposium, 2020

Testing Scouting Logic-Based Computation-in-Memory Architectures.

Moritz Fieback, Surya Nagarajan, Rajendra Bishnoi, Mehdi B. Tahoori, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the IEEE European Test Symposium, 2020

A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs.

Guilherme Cardoso Medeiros, Cemil Cem Gürsoy, Lizhou Wu, Moritz Fieback, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020

2019

Testing Computation-in-Memory Architectures Based on Emerging Memories.

Said Hamdioui, Moritz Fieback, Surya Nagarajan, Mottaqiallah Taouil

Proceedings of the IEEE International Test Conference, 2019

Device-Aware Test: A New Test Approach Towards DPPB Level.

Moritz Fieback, Lizhou Wu, Guilherme Cardoso Medeiros, Hassen Aziza, Siddharth Rao, Erik Jan Marinissen, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the IEEE International Test Conference, 2019

DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs.

Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Moritz Fieback, Leticia Bolzani Poehls, Said Hamdioui

Proceedings of the 24th IEEE European Test Symposium, 2019

Rebooting Computing: The Challenges for Test and Reliability.

Alberto Bosio, Ian O'Connor, Gennaro Severino Rodrigues, Fernanda Lima Kastensmidt, Elena I. Vatajelu, Giorgio Di Natale, Lorena Anghel, Surya Nagarajan, Moritz Fieback, Said Hamdioui

Proceedings of the 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2019

2018

Ionizing radiation modeling in DRAM transistors.

Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui, Marco Rovatti

Proceedings of the 19th IEEE Latin-American Test Symposium, 2018

Testing Resistive Memories: Where are We and What is Missing?

Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the IEEE International Test Conference, 2018