Moo-Young Park

According to our database, Moo-Young Park authored at least 1 paper in 2004.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2004

A study of an abnormal ESD failure mechanism and threshold voltage caused by ESD current zapping sequence.

Yong-Ha Song, Choong-Kyun Kim, Moo-Young Park, Bum-Suk Kye, Jeongil Seo, Dong-Soo Cho, Taek-Soo Kim, Gab-soo Han

Microelectron. Reliab., 2004