Monica Lobetti Bodoni

According to our database, Monica Lobetti Bodoni authored at least 12 papers between 1996 and 2003.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2003

Guest Editors' Introduction: Board Test.

Monica Lobetti Bodoni, Ben Bennetts

IEEE Des. Test Comput., 2003

Programmable built-in self-testing of embedded RAM clusters in system-on-chip architectures.

Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, Monica Lobetti Bodoni

IEEE Commun. Mag., 2003

2002

Panel: "Board Test and ITC: What Does the Future Hold?".

Monica Lobetti Bodoni

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

Online and Offline BIST in IP-Core Design.

Alfredo Benso, Silvia Chiusano, Giorgio Di Natale, Paolo Prinetto, Monica Lobetti Bodoni

IEEE Des. Test Comput., 2001

2000

A programmable BIST architecture for clusters of multiple-port SRAMs.

Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, Monica Lobetti Bodoni

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

A Family of Self-Repair SRAM Cores.

Alfredo Benso, Silvia Chiusano, Giorgio Di Natale, Paolo Prinetto, Monica Lobetti Bodoni

Proceedings of the 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 2000

On Integrating a Proprietary and a Commercial Architecture for Optimal BIST Performances in SoCs.

Alfredo Benso, Stefano Di Carlo, Silvia Chiusano, Paolo Prinetto, Fabio Ricciato, Monica Lobetti Bodoni, Maurizio Spadari

Proceedings of the IEEE International Conference On Computer Design: VLSI In Computers & Processors, 2000

An effective distributed BIST architecture for RAMs.

Monica Lobetti Bodoni, Alfredo Benso, Silvia Chiusano, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto

Proceedings of the 5th European Test Workshop, 2000

1999

Testing embedded memories in telecommunication systems.

Stefano Barbagallo, Monica Lobetti Bodoni, Alfredo Benso, Silvia Chiusano, Paolo Prinetto

IEEE Commun. Mag., 1999

An on-line BISTed SRAM IP core.

Monica Lobetti Bodoni, Alessio Pricco, Alfredo Benso, Silvia Chiusano, Paolo Prinetto

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1996

Scan insertion criteria for low design impact.

Stefano Barbagallo, Monica Lobetti Bodoni, Davide Medina, Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda

Proceedings of the 14th IEEE VLSI Test Symposium (VTS'96), April 28, 1996

A Parametric Design of a Built-in Self-Test FIFO Embedded Memory.

Stefano Barbagallo, Monica Lobetti Bodoni, Davide Medina, Gabriel de Blasio, M. Ferloni, Franco Fummi, Donatella Sciuto

Proceedings of the 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 1996