Mona Ganji

According to our database, Mona Ganji authored at least 8 papers between 2020 and 2023.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2023

Graph Theory Based Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits with Improved Time-Efficiency.

Marampally Saikiran, Michael Sekyere, Mona Ganji, Degang Chen

Proceedings of the IEEE East-West Design & Test Symposium, 2023

Digital Assisted Defect Detection Methods for Analog and Mixed Signal Circuits: An Overview.

Marampally Saikiran, Michael Sekyere, Mona Ganji, Degang Chen

Proceedings of the IEEE East-West Design & Test Symposium, 2023

2022

All Digital Low-Overhead SAR ADC Built-In Self-Test for Fault Detection and Diagnosis.

Mona Ganji, Marampally Saikiran, Degang Chen

Proceedings of the 40th IEEE VLSI Test Symposium, 2022

Digital Defect-Oriented Test Methodology for Flipped Voltage Follower Low Dropout (LDO) Voltage Regulators.

Marampally Saikiran, Mona Ganji, Degang Chen

Proceedings of the 35th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design, 2022

A Time-Efficient Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits.

Marampally Saikiran, Mona Ganji, Degang Chen

Proceedings of the 35th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design, 2022

Robust Built-in Defect-Detection for Low Drop-Out Regulators using Digital Mismatch Injection.

Marampally Saikiran, Mona Ganji, Degang Chen

Proceedings of the IEEE International Symposium on Circuits and Systems, 2022

A Wide-Range Low-cost Temperature to Digital Converter Independent of Device Models.

Mona Ganji, Marampally Saikiran, Degang Chen

Proceedings of the IEEE International Symposium on Circuits and Systems, 2022

2020

Robust DfT Techniques for Built-in Fault Detection in Operational Amplifiers with High Coverage.

Marampally Saikiran, Mona Ganji, Degang Chen

Proceedings of the IEEE International Test Conference, 2020