Mohd Fairuz Zakaria
According to our database1,
Mohd Fairuz Zakaria
authored at least 2 papers
between 2005 and 2006.
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Bibliography
2006
Reducing Burn-in Time through High-Voltage Stress Test and Weibull Statistical Analysis.
IEEE Des. Test Comput., 2006
2005
Shortening Burn-In Test: Application of a Novel Approach in optimizing Burn-In Time using Weibull Statistical Analysis with HVST.
Proceedings of the 14th Asian Test Symposium (ATS 2005), 2005