Mohammed Saif ur Rahman
Orcid: 0000-0002-6464-453X
According to our database1,
Mohammed Saif ur Rahman
authored at least 10 papers
between 2019 and 2024.
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Bibliography
2024
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2024
2023
Sensors, March, 2023
Detection of Surface Cracks in Metals Using Microwave and Millimeter-Wave Nondestructive Testing Techniques - A Review.
IEEE Trans. Instrum. Meas., 2023
2022
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2022
2021
IEEE Trans. Instrum. Meas., 2021
Proceedings of the IEEE International Conference on Imaging Systems and Techniques, 2021
Proceedings of the IEEE International Conference on Imaging Systems and Techniques, 2021
2020
High Resolution and Polarization Independent Microwave Near-Field Imaging Using Planar Resonator Probes.
IEEE Access, 2020
2019
Millimeter Wave Imaging of Surface Defects and Corrosion under Paint using V-band Reflectometer.
Proceedings of the 2019 IEEE International Conference on Imaging Systems and Techniques, 2019
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2019