Mohammad Athar Khalil

According to our database, Mohammad Athar Khalil authored at least 3 papers between 2001 and 2004.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2004

Hierarchical extreme-voltage stress test of analog CMOS ICs for gate-oxide reliability enhancement.

Chin-Long Wey, Mohammad Athar Khalil, Jim Liu, Gregory Wierzba

Proceedings of the 14th ACM Great Lakes Symposium on VLSI 2004, 2004

2001

High-Voltage Stress Test Paradigms of Analog CMOS ICs for Gate-Oxide Reliability Enhancement.

Mohammad Athar Khalil, Chin-Long Wey

Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001

Extreme-voltage stress vector generation of analog CMOS ICs for gate-oxide reliability enhancement.

Mohammad Athar Khalil, Chin-Long Wey

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001