Mohamed Naili

According to our database, Mohamed Naili authored at least 10 papers between 2001 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Time to Retrain? Detecting Concept Drifts in Machine Learning Systems.

Tri Minh Triet Pham, Karthikeyan Premkumar, Mohamed Naili, Jinqiu Yang

CoRR, 2024

2023

Unsupervised GAN-Based Intrusion Detection System Using Temporal Convolutional Networks and Self-Attention.

Paulo Freitas de Araujo-Filho, Mohamed Naili, Georges Kaddoum, Emmanuel Thepie Fapi, Zhongwen Zhu

IEEE Trans. Netw. Serv. Manag., December, 2023

2022

Multi-Objective GAN-Based Adversarial Attack Technique for Modulation Classifiers.

Paulo Freitas de Araujo-Filho, Georges Kaddoum, Mohamed Naili, Emmanuel Thepie Fapi, Zhongwen Zhu

IEEE Commun. Lett., 2022

Deep Reinforcement Learning for Penetration Testing of Cyber-Physical Attacks in the Smart Grid.

Yuanliang Li, Jun Yan, Mohamed Naili

Proceedings of the International Joint Conference on Neural Networks, 2022

2019

Stability-based model for evacuation system using agent-based social simulation and Monte Carlo method.

Makhlouf Naili, Mustapha Bourahla, Mohamed Naili

Int. J. Simul. Process. Model., 2019

Stability-based Dynamic Bayesian Network method for dynamic data mining.

Mohamed Naili, Mustapha Bourahla, Makhlouf Naili, AbdelKamel Tari

Eng. Appl. Artif. Intell., 2019

2016

Election-based method for fault tolerance in a hierarchical sensor network (EFTOHSN): a case study of an indoor localisation system.

Mohamed Naili, Achour Achroufene, Makhlouf Naili

Int. J. Sens. Networks, 2016

2015

Brain-inspired method for solving fuzzy multi-criteria decision making problems (BIFMCDM).

Mohamed Naili, Abdelhak Boubetra, Abdelkamel Tari, Yacine Bouguezza, Achour Achroufene

Expert Syst. Appl., 2015

2014

Mobile Commerce Websites Ranking.

Mohamed Naili, Abdelhak Boubetra, Abdelkamel Tari

Proceedings of the Eighth International Conference on Next Generation Mobile Apps, 2014

2001

In situ crystallisation in ZrO₂ thin films during high temperature X-ray diffraction.

Chao Zhao, Gert Roebben, Hugo Bender, Edward Young, S. Haukka, Michel Houssa, Mohamed Naili, Stefan De Gendt, Marc M. Heyns, Omer Van der Biest

Microelectron. Reliab., 2001