Mitsuya Fukazawa

According to our database, Mitsuya Fukazawa authored at least 12 papers between 2005 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

A 24-OSR to Simplify Anti-Aliasing Filter 2MHz-BW 83dB-DR 3rd-order DT-DSM using FIA-Based Integrator and Noise-Shaping SAR Combined Digital Noise-Coupling Quantizer.

Mitsuya Fukazawa, Tetsuo Matsui

Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023

2021

A CT 2-2 MASH ΔΣ ADC With Multi-Rate LMS-Based Background Calibration and Input-Insensitive Quantization-Error Extraction.

Mitsuya Fukazawa, Takashi Oshima, Masaki Fujiwara, Katsuki Tateyama, Atsushi Ochi, Alsubaie Raed, Tetsuo Matsui

IEEE J. Solid State Circuits, 2021

2020

9.7 Background Multi-Rate LMS Calibration Circuit for 15MHz-BW 74dB-DR CT 2-2 MASH ΔΣ ADC in 28nm CMOS.

Mitsuya Fukazawa, Takashi Oshima, Masaki Fujiwara, Katsuki Tateyama, Alsubaie Raed, Masao Ito, Tetsuya Matsumoto, Tetsuo Matsui

Proceedings of the 2020 IEEE International Solid- State Circuits Conference, 2020

A High-Precision Analog Front End Integrated in a 32bit Microcontroller for Industrial Sensing Applications.

Koji Yoichi, Sugako Otani, Kazutoshi Tsuda, Naoya Tokimoto, Hideki Kamegawa, Yoshihisa Satou, Shioto Tanaka, Hideki Otsu, Mitsuru Hiraki, Masao Ito, Mitsuya Fukazawa, Hiroyuki Kondo

Proceedings of the IEEE Asian Solid-State Circuits Conference, 2020

2009

Experimental Evaluation of Dynamic Power Supply Noise and Logical Failures in Microprocessor Operations.

Mitsuya Fukazawa, Masanori Kurimoto, Rei Akiyama, Hidehiro Takata, Makoto Nagata

IEICE Trans. Electron., 2009

2007

Fine-Grained In-Circuit Continuous-Time Probing Technique of Dynamic Supply Variations in SoCs.

Mitsuya Fukazawa, Tetsuro Matsuno, Toshifumi Uemura, Rei Akiyama, Tetsuya Kagemoto, Hiroshi Makino, Hidehiro Takata, Makoto Nagata

Proceedings of the 2007 IEEE International Solid-State Circuits Conference, 2007

2006

An Integrated Timing and Dynamic Supply Noise Verification for Multi-10-Million Gate SoC Designs.

Kenji Shimazaki, Makoto Nagata, Mitsuya Fukazawa, Shingo Miyahara, Masaaki Hirata, Kazuhiro Satoh, Hiroyuki Tsujikawa

IEICE Trans. Electron., 2006

Measurement-Based Analysis of Delay Variation Induced by Dynamic Power Supply Noise.

Mitsuya Fukazawa, Makoto Nagata

IEICE Trans. Electron., 2006

Delay Variation Analysis in Consideration of Dynamic Power Supply Noise Waveform.

Mitsuya Fukazawa, Makoto Nagata

Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, 2006

A built-in power supply noise probe for digital LSIs.

Mitsuya Fukazawa, Koichiro Noguchi, Makoto Nagata, Kazuo Taki

Proceedings of the 2006 Conference on Asia South Pacific Design Automation: ASP-DAC 2006, 2006

2005

An integrated timing and dynamic supply noise verification for nano-meter CMOS SoC designs.

Kenji Shimazaki, Mitsuya Fukazawa, Makoto Nagata, Shingo Miyahara, Masaaki Hirata, Kazuhiro Satoh, Hiroyuki Tsujikawa

Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005

Substrate-noise and random-fluctuations reduction with self-adjusted forward body bias.

Yoshihide Komatsu, Koichiro Ishibashi, Masaharu Yamamoto, Toshiro Tsukada, Kenji Shimazaki, Mitsuya Fukazawa, Makoto Nagata

Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005